SFFS550 March 2024 OPA2607-Q1 , OPA607-Q1
Figure 4-1 shows the OPAx607-Q1 pin diagram for the DBV package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the OPAx607-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT | 1 | Short to GND may cause device to overheat. | B |
VS- | 2 | Normal operation if single supply configuration is used. | D |
IN+ | 3 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
IN- | 4 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
VS+ | 5 | Diodes from input to VS+ may turn on due to input signal and cause electrical overstress (EOS). | A |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT | 1 | Output can be left open. There is no effect on the device, but the output will not be measured. | C |
VS- | 2 | Lowest voltage output pin will try to power the VS-pin of the device. | B |
IN+ | 3 | Floating input, circuit will likely not function as expected. | C |
IN- | 4 | Floating input, circuit will likely not function as expected. | C |
VS+ | 5 | Highest voltage output pin will try to power the VS+ pin of the device. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
OUT | 1 | VS- | Short to VS- may cause device to overheat. | B |
VS- | 2 | IN+ | Input at V- (GND) is valid input, however, desired application result is unlikely. | C |
IN+ | 3 | IN- | No damage to device. Application circuit will not work. Pins are not adjacent to each other. | C |
IN- | 4 | VS+ | May cause device to overheat. Input at VS+ is not a valid input. Pins are not as near to each other, due to package type. | B |
VS+ | 5 | OUT | Short to VS+ may cause device to overheat. Pins are not adjacent to each other. | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT | 1 | Short to Vs+ may cause device to overheat. | B |
VS- | 2 | Diodes from input to VS- may turn on due to input signal and cause electrical overstress (EOS). | A |
IN+ | 3 | Input at VS+ is a valid input, however, desired application result is unlikely. | C |
IN- | 4 | Input at VS+ is a valid input, however, desired application result is unlikely. | C |
VS+ | 5 | Normal operation. | D |