SFFS592 August   2024 LM2936Q-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC Package
    2. 2.2 TO-252 Package
    3. 2.3 VSSOP Package
    4. 2.4 SOT-223 Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC Package
    2. 4.2 TO-252 Package
    3. 4.3 VSSOP Package
    4. 4.4 SOT-223 Package

Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM2936Q-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
No output (output low)15
Output high (following input) 20
Short any two adjacent pins5
Output not in specification60