Information redundancy techniques can be applied via software as an additional runtime diagnostic. In order to provide diagnostic coverage for network elements outside the C2000 MCU (wiring harness, connectors, transceiver) end-to-end safety mechanisms are applied. These mechanisms can also provide diagnostic coverage inside the C2000 MCU.

In the case of processing elements (CPU and CLA), this refers to multiple executions of the code and software based cross checking to ensure correctness. The multiple execution and result comparison may be based on either the same code executed multiple times or diversified software code implemented. For details regarding the implementation, see the ISO26262-5, D.2.3.4.

In the case of the DMA, information redundancy techniques refers to additional information besides the data payload which ensures data integrity. For example, SECDED codes, parity codes, CRCs etc. enable information redundancy.

Typical control applications involve measuring three phase the voltage and current. These values are either sampled directly using the on chip ADC or send to the TMS320F28P65xD/S MCU by the sensors which are captured using ECAP, SDFM, and so forth. In such scenarios, the correlation between input signals can be used to check the integrity (for example, if the three phase voltage, V1, V2, V3 is being measured, the function V₁ + V₂ + V₃ = 0 can be used to provide diagnostic coverage for input signal integrity).

In the case of SRAM and FLASH memory, critical data, program, variables, and so forth can be stored redundantly and compared before it is getting used. Care should be taken to avoid compiler optimizing code containing redundant data/programs.