SFFS766 November 2023 OPA2377-Q1
The failure mode distribution estimation for the OPA2377-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
Output open (Hi-Z) | 30% |
| Output saturate low | 25% |
| Output saturate high | 25% |
| Output functional, not in specification voltage or timing | 20% |