SFFS789 February 2024 TXV0106-Q1
The failure mode distribution estimation for TXV0106-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Driver HIZ no output | 31% |
| Functional fail (voltage, timing; out of specification) | 33% |
| Driver stuck at fault high | 14% |
| Driver stuck at fault low | 14% |
| Driver stuck at undetermined state | 8% |