SFFS790 February 2024 TXV0108-Q1
This section provides Functional Safety Failure In Time (FIT) rates for VQFN package of TXV0108-Q1 based on industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 11 |
Die FIT Rate | 2 |
Package FIT Rate | 9 |
The failure rate and mission profile information in Table 2-2 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS Analog switch, Bus Interface | 5 FIT | 55°C |
The reference FIT rate and reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.