SFFS796 January 2024 LMR43606-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the LMR43606-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the LMR43606-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LMR43606-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
RT or MODE/SYNC | 1 | The switching frequency is 2.2MHz. | D |
PGOOD | 2 | When not in use, this pin can be left grounded (PGOOD is not a valid signal and VOUT is normal). | D |
EN/UVLO | 3 | VOUT = 0V (Enable is off and functionality is halted.) | D |
VIN | 4 | VOUT = 0V | B |
SW | 5 | Damage to HSFET | A |
BOOT | 6 | VOUT = 0V. HS does not turn on. | B |
VCC | 7 | VOUT = 0V | B |
VOUT/BIAS or FB | 8 | When in adjustable output mode, VOUT approaches VIN. When in fixed output mode, VOUT = 0V. | B |
GND | 9 | VOUT is normal. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
RT or MODE/SYNC | 1 | If it is an RT part, frequency is not defined. If it is a MODE/SYNC part, then the part can go back and forth between FPWM/PFM. The part is up and functional. | C |
PGOOD | 2 | When not in use, this pin can be left open (PGOOD is not a valid signal and VOUT is normal). | D |
EN/UVLO | 3 | Pin cannot be left floating. | B |
VIN | 4 | VOUT = 0V | B |
SW | 5 | VOUT = 0V | B |
BOOT | 6 | VOUT = 0. HS does not turn on. | B |
VCC | 7 | VCC output is unstable and can increase above 5.5V. | A |
VOUT/BIAS or FB | 8 | VOUT approaches VIN. | C |
GND | 9 | VOUT can be abnormal, as reference voltage is not fixed. | C |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
RT or MODE/SYNC | 1 | PGOOD | If PGOOD is high, and less than 5.5V, FSW = 1MHz. If PGOOD is low, FSW = 2.2MHz. With PGOOD absolute maximum rating being 20V, RT ESD damages if PG goes to 20V. | A |
PGOOD | 2 | EN/UVLO | If EN/UVLO is greater than 20V, it damages devices connected to the PGOOD pin. | A |
EN/UVLO | 3 | VIN | VOUT is normal (Enable is on and all other blocks work). | D |
VIN | 4 | SW | Damage to LSFET | A |
SW | 5 | BOOT | VOUT = 0V, HS does not turn on and there is no CBOOT. | B |
BOOT | 6 | VCC | Damage occurs and there is a break to the VCC pin. | A |
VCC | 7 | VOUT/BIAS or FB | Does not work, but no damage occurs. | B |
VOUT/BIAS or FB | 8 | GND | When in adjustable output mode, VOUT approaches VIN. When in fixed output mode, VOUT = 0V. | B |
GND | 9 | RT or MODE/SYNC | VOUT is normal if the RT/MODE/SYNC pin is low, otherwise not functional. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
RT or MODE/SYNC | 1 | If VIN is greater than 5.5V, damage occurs. If VIN < 5.5V, switching frequency is 1MHz. | A |
PGOOD | 2 | If VIN is less than 20V, it damages PGOOD. | A |
EN/UVLO | 3 | VOUT is normal (Enable is on, all other blocks will work). | D |
VIN | 4 | VOUT is normal. | D |
SW | 5 | Damage to LSFET | A |
BOOT | 6 | Damage occurs and BOOT ESD clamp is damaged. | A |
VCC | 7 | If VIN is greater than 5.5V, damage occurs. | A |
VOUT/BIAS or FB | 8 | If VIN is greater than 16V, damage occurs. | A |
GND | 9 | VOUT = 0V | B |