SFFS800 January 2024 LM74500-Q1
The failure mode distribution estimation for LM74500-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| GATE output stuck Low or HIZ | 50% |
| GATE output not in specification – voltage or timing | 40% |
| GATE output stuck on Hi | 5% |
| Short circuit any two pins | 5% |