SFFS826A February 2024 – April 2024 LDC0851
The failure mode distribution estimation for the LDC0851 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Output stuck in HIGH state | 35 |
Output stuck in LOW state | 15 |
Output stuck Hi-Z | 5 |
Switching Distance error (Output switches at incorrect threshold) | 45 |