SFFS845 April 2024 CD74HCT4067-Q1
The failure mode distribution estimation for the CD74HCT4067-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
MUX no output (HIZ) | 35 |
MUX channel stuck on | 10 |
MUX channel stuck off | 10 |
MUX functional out of specification voltage or timing | 45 |