1 Overview

This document contains information for the ISOTMP35-Q1 (DFQ package) to aid in functional safety system designs. This document discusses:

• Functional safety failure In time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards in combination with expert judgement
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

The ISOTMP35-Q1 was developed using a quality-managed development process, but was not developed in accordance with the ISO 26262 standards.