SFFS927 July 2024 ISO7741TA-Q1 , ISO7741TB-Q1
Figure 4-1 shows the ISO7741Tx-Q1 pin diagram for the 16-DW SOIC package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the ISO7741Tx-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
D1 | 1 | D1 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. | A |
D2 | 2 | D2 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. | A |
GND1 | 3 | Device continues to function as expected. Normal operation. | D |
VCC1 | 4 | No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. | A |
INA | 5 | Input signal shorted to ground, so OUTA output is stuck low. Communication from INA to OUTA is corrupted. | B |
INB | 6 | Input signal shorted to ground, so OUTB output is stuck low. Communication from INB to OUTB is corrupted. | B |
INC | 7 | Input signal shorted to ground, so OUTC output is stuck low. Communication from INC to OUTC is corrupted. | B |
OUTD | 8 | OUTD output shorted to ground. Data communication from IND to OUTD is corrupted. Device damage is possible if IND is driven high for an extended period of time. | A |
GND2 | 9 | Device continues to function as expected. Normal operation. | D |
IND | 10 | Input signal shorted to ground, so OUTD output is stuck low. Communication from IND to OUTD is corrupted. | B |
OUTC | 11 | OUTC output shorted to ground. Data communication from INC to OUTC is corrupted. Device damage is possible if INC is driven high for an extended period of time. | A |
OUTB | 12 | OUTB output shorted to ground. Data communication from INB to OUTB is corrupted. Device damage is possible if INB is driven high for an extended period of time. | A |
OUTA | 13 | OUTA output shorted to ground. Data communication from INA to OUTA is corrupted. Device damage is possible if INA is driven high for an extended period of time. | A |
NC | 14 | Device continues to function as expected. Normal operation. | D |
GND2 | 15 | Device continues to function as expected. Normal operation. | D |
VCC2 | 16 | No power to the device on side-2. State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output is at default state. | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
D1 | 1 | With D1 open, one primary transformer winding does not store energy. Output voltage out of target operating point. | B |
D2 | 2 | With D2 open, one primary transformer winding does not store energy. Output voltage out of target operating point. | B |
GND1 | 3 | No power to device side-1 (missing ground return). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output is undetermined. | B |
VCC1 | 4 | No power to device side-1 (supply is open). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output is undetermined or through internal ESD diode on INA/INB/INC pin the device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage is plausible. | B |
INA | 5 | No communication to INA channel is possible. OUTA output at default state. | B |
INB | 6 | No communication to INB channel is possible. OUTB output at default state. | B |
INC | 7 | No communication to INC channel is possible. OUTC output at default state. | B |
OUTD | 8 | State of OUTD output undetermined. Data communication from IND to OUTD is corrupted. | B |
GND2 | 9 | Device gets return ground through pin15. Normal operation. | D |
IND | 10 | No communication to IND channel is possible. OUTD output at default state. | B |
OUTC | 11 | State of OUTC output is undetermined. Data communication from INC to OUTC is corrupted. | B |
OUTB | 12 | State of OUTB output is undetermined. Data communication from INB to OUTB is corrupted. | B |
OUTA | 13 | State of OUTA output is undetermined. Data communication from INA to OUTA is corrupted. | B |
NC | 14 | Device continues to function as expected. Normal operation. | D |
GND2 | 15 | Device gets return ground through pin 9. Normal operation. | D |
VCC2 | 16 | No power to the device on side-2 (supply is open). State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output at default state. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
D1 | 1 | D2 | With D1 shorted to D2, there is incorrect current flow in the primary transformer windings. Output voltage out of target operating point. | A |
D2 | 2 | GND | D2 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. | A |
GND1 | 3 | VCC1 | No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. | A |
VCC1 | 4 | INA | Input signal shorted to supply, so OUTA output is stuck high. Communication from INA to OUTA is corrupted. | B |
INA | 5 | INB | Communication corrupted for either or both channels. | B |
INB | 6 | INC | Communication corrupted for either or both channels. | B |
INC | 7 | OUTD | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
OUTD | 8 | - | Not considered, corner pin. | - |
GND2 | 9 | IND | Input signal shorted to ground, so OUTD output is stuck low. Communication from IND to OUTD is corrupted. | B |
IND | 10 | OUTC | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
OUTC | 11 | OUTB | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
OUTB | 12 | OUTA | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
OUTA | 13 | NC | Device continues to function as expected. Normal operation. | D |
NC | 14 | GND2 | Device continues to function as expected. Normal operation. | D |
GND2 | 15 | VCC2 | No power to the device on side-2 (supply is shorted to ground). State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output at default state. | B |
VCC2 | 16 | - | Not considered corner pin. | - |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
D1 | 1 | D1 stuck high. Makes potential difference between one transformer winding zero. When D1 FET switches are on, high current flows from supply to ground and device damage is possible. Isolated output supply out of intended set-point. | A |
D2 | 2 | D2 stuck high. Makes potential difference between one transformer winding zero. When D2 FET switches on, high current flows from supply to ground and device damage is possible. Isolated output supply out of intended set-point. | A |
GND1 | 3 | No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. | A |
VCC1 | 4 | No effect. Normal operation. | D |
INA | 5 | Input signal shorted to supply, so OUTA output is stuck high. Communication from INA to OUTA is corrupted. | B |
INB | 6 | Input signal shorted to supply, so OUTB output is stuck high. Communication from INB to OUTB is corrupted. | B |
INC | 7 | Input signal shorted to supply, so OUTB output is stuck high. Communication from INB to OUTB is corrupted. | B |
OUTD | 8 | OUTD stuck high. Data communication from INC to OUTC is lost. Device damage is possible if IND is driven low for an extended period of time. | A |
GND2 | 9 | Can create a potential difference between pin9 and pin15, causing high current to flow in the device and device damage is possible. | A |
IND | 10 | Input signal shorted to supply, so OUTD output is stuck high. Communication from IND to OUTD is corrupted. | B |
OUTC | 11 | OUTC shorted to supply (high). Communication from INC to OUTC is corrupted. If INC is low for extended duration, OUTC shorted to supply causes high current and can possibly damage the device. | A |
OUTB | 12 | OUTB shorted to supply (high). Communication from INB to OUTB is corrupted. If INB is low for an extended duration, OUTB shorted to supply causes high current and can possibly damage the device. | A |
OUTA | 13 | OUTA shorted to supply (high). Communication from INA to OUTA is corrupted. If INA is low for extended duration, OUTA shorted to supply causes high current and can possibly damage the device. | A |
NC | 14 | Device continues to function as expected. Normal operation. | D |
GND2 | 15 | Shorting pin 15 to supply can create potential difference between pin9 and pin15, causing high current to flow in the device and device damage is possible. | A |
VCC2 | 16 | Device continues to function as expected. Normal operation. | D |