SLOA298 October 2020 OPA320-Q1
The failure mode distribution estimation for Device Name in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
Output open (Hi-Z) | 20% |
Output saturate high | 25% |
Output saturate lot | 25% |
Output functional, not in specification voltage or timing | 30% |