SLOK017 June   2024 TLV1H103-SEP

PRODUCTION DATA  

  1.   1
  2. TLV1H103-SEP Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. Overview
  5. SEE Mechanisms
  6. Test Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Results
    1. 6.1 Single Event Latchup (SEL) Results
    2. 6.2 Single Event Transient (SET) Results
  9. Summary
  10. SET Results Appendix
  11. Confidence Interval Calculations
  12. 10References

Single Event Transient (SET) Results

The TLV1H103-SEP was characterized from 50.5 to 1.0 MeV-cm2 / mg at 2.4V, 3.3V, and 5.5V supply voltages in both output high and output low configuration. The device was tested at room temperature for all SETs runs. A nominal flux of 105 ions / s-cm2 was used, with each run concluding once a fluence of 107 ions/cm2 was reached. The device was tested at approximately 25°C as it was exposed to six LETEFF readpoints of 50.5 MeV-cm2 / mg, 35.6 MeV-cm2 / mg, 23.1 MeV-cm2 / mg, 9.8 MeV-cm2 / mg, 5.3 MeV-cm2 / mg, and 1.0 MeV-cm2 / mg. The output was monitored with the oscilloscope set to a window trigger mode that captured any events where the output shifted by ±250mV or more. The conditions and results for each run are summarized in the tables below. See SET Results Appendix for histograms of the transient magnitudes and transient waveforms.

Table 6-2 SET Run Summary for TLV1H103-SEP in Output High Condition
RUN #

DUT

Output Condition

TEMPERATURE
(°C)
IONANGLEFLUX
(ions·cm2/mg)
FLUENCE
(# ions)
LETEFF
(MeV.cm2/mg)

Vs = VCC - VEE

# of Events

324

High

25Xe01.020

E+05

1.00

E+07

50.52.4178
334

High

25

Xe01.023

E+05

1.00

E+07

50.53.3174
344

High

25Xe01.010

E+05

1.00

E+07

50.55.5329
1134

High

25Kr01.122

E+05

1.00

E+07

35.62.481
1144

High

25

Kr01.129

E+05

1.00

E+07

35.63.3132
1164

High

25Kr01.066

E+05

1.00

E+07

35.65.5238
1734

High

25Kr00.989

E+05

1.00

E+07

23.12.439
1744

High

25

Kr01.025

E+05

1.00

E+07

23.13.366
1764

High

25Kr01.041

E+05

1.00

E+07

23.15.595
1924

High

25Ar00.998

E+05

1.00

E+07

9.82.413
1934

High

25

Ar00.999

E+05

1.00

E+07

9.83.318
1944

High

25Ar00.982

E+05

1.00

E+07

9.85.559
2024

High

25Ar00.924

E+05

1.00

E+07

5.32.40
2034

High

25

Ar00.945

E+05

1.00

E+07

5.33.31
2044

High

25Ar00.956

E+05

1.00

E+07

5.35.52
2884

High

25O01.059

E+05

1.00

E+07

1.02.40
2894

High

25

O01.069

E+05

1.00

E+07

1.03.30
2904

High

25O01.081

E+05

1.00

E+07

1.05.50

Table 6-3 SET Run Summary for TLV1H103-SEP in Output Low Condition
RUN #

DUT

Output Condition

TEMPERATURE
(°C)
IONANGLEFLUX
(ions·cm2/mg)
FLUENCE
(# ions)
LETEFF
(MeV.cm2/mg)

Vs = VCC - VEE

# of Events

354

Low

25Xe01.019

E+05

1.00

E+07

50.52.493
364

Low

25Xe01.025

E+05

1.00

E+07

50.53.3102
374

Low

25Xe01.019

E+05

1.00

E+07

50.55.5303
1174

Low

25Kr01.045

E+05

1.00

E+07

35.62.461
1184

Low

25Kr01.039

E+05

1.00

E+07

35.63.369
1194

Low

25Kr01.051

E+05

1.00

E+07

35.65.5170
1774

Low

25Kr01.039

E+05

1.00

E+07

23.12.434
1784

Low

25Kr01.011

E+05

1.00

E+07

23.13.348
1794

Low

25Kr00.992

E+05

1.00

E+07

23.15.570
1954

Low

25Ar00.978

E+05

1.00

E+07

9.82.40
1964

Low

25Ar00.981

E+05

1.00

E+07

9.83.32
1974

Low

25Ar00.980

E+05

1.00

E+07

9.85.52
1984

Low

25Ar00.973

E+05

1.00

E+07

5.32.40
1994

Low

25Ar00.945

E+05

1.00

E+07

5.33.30
2004

Low

25Ar00.934

E+05

1.00

E+07

5.35.50
2914

Low

25O01.079

E+05

1.00

E+07

1.02.40
2924

Low

25O01.065

E+05

1.00

E+07

1.03.30
2934

Low

25O01.069

E+05

1.00

E+07

1.05.50
Figures 6-7 to 6-10 show two examples of a typical transient event at 5.5V supply and LETEFF = 50.5 MeV-cm2 / mg. Their corresponding supply current was also recorded.

TLV1H103-SEP Run 34, Event 90, Output HighFigure 6-7 Run 34, Event 90, Output High
TLV1H103-SEP Run 37, Event 148, Output LowFigure 6-9 Run 37, Event 148, Output Low
TLV1H103-SEP Run 34, Event 90, Supply CurrentFigure 6-8 Run 34, Event 90, Supply Current
TLV1H103-SEP Run 37, Event 148, Supply CurrentFigure 6-10 Run 37, Event 148, Supply Current

Weibull Fit

Weibull-Fit and cross section plots for the TLV1H103-SEP at supply voltages of 2.4V, 3.3V, and 5.5V are shown in the figures below respectively. For each of the supply voltages, the total number of transients (both output high and output low combined) and the run fluences are used to calculate the mean (σMEAN), upper bound (σUB), and lower bound (σLB) cross section (as discussed in Appendix C) at 95% confidence interval. The Weibull equation used for the fit is presented in Equation 1, and parameters are shown in Table 6-10.

TLV1H103-SEP Cross Section and Weibull Fit for 2.4V Supply, Output LowFigure 6-11 Cross Section and Weibull Fit for 2.4V Supply, Output Low
TLV1H103-SEP Cross Section and Weibull Fit for 2.4V Supply, Output HighFigure 6-12 Cross Section and Weibull Fit for 2.4V Supply, Output High
TLV1H103-SEP Cross Section and Weibull Fit for 3.3V Supply, Output LowFigure 6-13 Cross Section and Weibull Fit for 3.3V Supply, Output Low
TLV1H103-SEP Cross Section and Weibull Fit for 3.3V Supply, Output HighFigure 6-14 Cross Section and Weibull Fit for 3.3V Supply, Output High
TLV1H103-SEP Cross Section and Weibull Fit for 5.5V Supply, Output LowFigure 6-15 Cross Section and Weibull Fit for 5.5V Supply, Output Low
TLV1H103-SEP Cross Section and Weibull Fit for 5.5V Supply, Output HighFigure 6-16 Cross Section and Weibull Fit for 5.5V Supply, Output High

Table 6-4 Cross Section and Weibull Fit Data: 2.4V Supply, Output Low
LETEFF(MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

93

7.51E-069.3E-068.85E-064.49E-072.01E-131.14E-052.09E-061.79E-06
35.6

Kr

1.00E+07

61

4.67E-066.1E-066.4E-06-2.96E-078.78E-147.84E-061.74E-061.43E-06
23.1

Kr

1.00E+07

34

2.35E-063.4E-062.34E-061.06E-061.13E-124.75E-061.35E-061.05E-06
9.8

Ar

1.00E+07

0

000003.69E-073.69E-070
5.3

Ar

1.00E+07

0

000003.69E-073.69E-070
1.0

O

1.00E+07

0

000003.69E-073.69E-070

Table 6-5 Cross Section and Weibull Fit Data: 2.4V Supply, Output High
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

178

1.53E-051.78E-051.65E-051.28E-061.65E-122.06E-052.82E-062.52E-06
35.6

Kr

1.00E+07

81

6.43E-068.1E-061.03E-05-2.15E-064.64E-121.01E-051.97E-061.67E-06
23.1

Kr

1.00E+07

39

2.77E-063.9E-063.13E-067.68E-075.90E-135.33E-061.43E-061.13E-06
9.8

Ar

1.00E+07131.07E-061.80E-067.31E-081.73E-062.98E-122.84E-061.04E-067.33E-07
5.3

Ar

1.00E+07

0

000003.69E-073.69E-070
1.0

O

1.00E+07

0

000003.69E-073.69E-070

Table 6-6 Cross Section and Weibull Fit Data: 3.3V Supply, Output Low
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

102

8.32E-061.02E-059.85E-063.49E-071.22E-131.24E-052.18E-61.88E-06
35.6

Kr

1.00E+07

69

5.37E-066.9E-067.69E-06-7.86E-076.17E-138.73E-061.83E-061.53E-06
23.1

Kr

1.00E+07

48

3.54E-064.80E-063.59E-061.21E-061.45E-126.36E-061.56E-061.26E-06
9.8

Ar

1.00E+07

2

2.42E-082.00E-072.13E-07-1.29E-081.66E-167.22E-075.22E-071.76E-07
5.3

Ar

1.00E+07

0

000003.69E-073.69E-070
1.0

O

1.00E+07

0

000003.69E-073.69E-070

Table 6-7 Cross Section and Weibull Fit Data: 3.3V Supply, Output High
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

174

1.49E-051.74E-051.69E-055.27E-072.78E-132.02E-052.79E-062.49E-06
35.6

Kr

1.00E+07

132

1.10E-051.32E-051.32E-05-2.99E-088.92E-161.57E-052.45E-062.16E-06
23.1

Kr

1.00E+07

66

5.1E-066.60E-066.48E-061.21E-071.47E-148.40E-061.80E-061.50E-06
9.8

Ar

1.00E+07

18

1.07E-061.80E-067.92E-071.01E-061.02E-122.84E-061.04E-067.33E-07
5.3

Ar

1.00E+07

1

2.53E-091.00E-071.35E-07-3.48E-081.21E-155.57E-074.57E-079.75E-08
1.0

O

1.00E+07

0

000003.69E-073.69E-070

Table 6-8 Cross Section and Weibull Fit Data: 5.5V Supply, Output Low
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

303

2.70E-053.03E_052.96E-057.40E-075.47E-133.39E-053.61E-063.32E-06
35.6

Kr

1.00E+07

170

1.45E-051.70E-051.95E-05-2.51E-066.29E-121.98E-052.76E-062.46E-06
23.1

Kr

1.00E+07

70

5.46E-067.00E-065.2E-061.80E-063.25E-128.84E-061.84E-061.54E-06
9.8

Ar

1.00E+07

2

2.42E-082.00E-076.99E-081.30E-071.69E-147.22E-075.22E-071.76E-07
5.3

Ar

1.00E+07

0

000003.69E-073.69E-070
1.0

O

1.00E+07

0

000003.69E-073.69E-070

Table 6-9 Cross Section and Weibull Fit Data: 5.5V Supply, Output High
Energy (MeV-cm2 /mg)IonFluence (Ions/cm2)Total EventsσLB (cm2/ Device)σMEAN (cm2/ Device)FITResidualResidual2σUB (cm2/ Device)UB ErrorLB Error
50.5

Xe

1.00E+07

329

2.94E-053.29E-053.16E-051.31E-061.72E-123.67E-053.75E-063.46E-06
35.6

Kr

1.00E+07

238

2.09E-052.38E-052.41E-05-2.77E-077.66E-142.70E-053.22E-062.93E-06
23.1

Kr

1.00E+07

95

7.69E-069.50E-061.15E-05-1.98E-063.92E-121.16E-052.11E-061.81E-06
9.8

Ar

1.00E+07

59

4.49E-065.90E-061.38E-064.52E-062.04E-117.61E-061.71E-061.41E-06
5.3

Ar

1.00E+07

2

2.42E-082.00E-072.35E-07-3.49E-081.22E-157.22E-075.22E-071.76E-07
1.0

O

1.00E+07

0

000003.69E-073.69E-070
Equation 1. TLV1H103-SEP

Table 6-10 Weibull Fit Parameters
ParametersValue for 2.4V Supply, Output LowValue for 2.4V Supply, Output HighValue for 3.3V Supply, Output LowValue for 3.3 V Supply, Output HighValue for 5.5V Supply, Output LowValue for 5.5V Supply, Output High

σSAT (cm2)

9.30E-061.78E-051.02E-051.74E-053.03E-053.29E-05
Onset (MeV-cm2 /mg)9.85.35.315.31
w243226303031
s2.12.82.22.53.22.5
Sum (Residual2)1.42E-128.38E-122.19E-121.31E-121.01E-112.61E-11