SLOK017 June 2024 TLV1H103-SEP
PRODUCTION DATA
The TLV1H103-SEP was characterized from 50.5 to 1.0 MeV-cm2 / mg at 2.4V, 3.3V, and 5.5V supply voltages in both output high and output low configuration. The device was tested at room temperature for all SETs runs. A nominal flux of 105 ions / s-cm2 was used, with each run concluding once a fluence of 107 ions/cm2 was reached. The device was tested at approximately 25°C as it was exposed to six LETEFF readpoints of 50.5 MeV-cm2 / mg, 35.6 MeV-cm2 / mg, 23.1 MeV-cm2 / mg, 9.8 MeV-cm2 / mg, 5.3 MeV-cm2 / mg, and 1.0 MeV-cm2 / mg. The output was monitored with the oscilloscope set to a window trigger mode that captured any events where the output shifted by ±250mV or more. The conditions and results for each run are summarized in the tables below. See SET Results Appendix for histograms of the transient magnitudes and transient waveforms.
RUN # | DUT | Output Condition | TEMPERATURE (°C) | ION | ANGLE | FLUX (ions·cm2/mg) | FLUENCE (# ions) | LETEFF (MeV.cm2/mg) | Vs = VCC - VEE | # of Events |
---|---|---|---|---|---|---|---|---|---|---|
32 | 4 | High | 25 | Xe | 0 | 1.020 E+05 | 1.00 E+07 | 50.5 | 2.4 | 178 |
33 | 4 | High | 25 | Xe | 0 | 1.023 E+05 | 1.00 E+07 | 50.5 | 3.3 | 174 |
34 | 4 | High | 25 | Xe | 0 | 1.010 E+05 | 1.00 E+07 | 50.5 | 5.5 | 329 |
113 | 4 | High | 25 | Kr | 0 | 1.122 E+05 | 1.00 E+07 | 35.6 | 2.4 | 81 |
114 | 4 | High | 25 | Kr | 0 | 1.129 E+05 | 1.00 E+07 | 35.6 | 3.3 | 132 |
116 | 4 | High | 25 | Kr | 0 | 1.066 E+05 | 1.00 E+07 | 35.6 | 5.5 | 238 |
173 | 4 | High | 25 | Kr | 0 | 0.989 E+05 | 1.00 E+07 | 23.1 | 2.4 | 39 |
174 | 4 | High | 25 | Kr | 0 | 1.025 E+05 | 1.00 E+07 | 23.1 | 3.3 | 66 |
176 | 4 | High | 25 | Kr | 0 | 1.041 E+05 | 1.00 E+07 | 23.1 | 5.5 | 95 |
192 | 4 | High | 25 | Ar | 0 | 0.998 E+05 | 1.00 E+07 | 9.8 | 2.4 | 13 |
193 | 4 | High | 25 | Ar | 0 | 0.999 E+05 | 1.00 E+07 | 9.8 | 3.3 | 18 |
194 | 4 | High | 25 | Ar | 0 | 0.982 E+05 | 1.00 E+07 | 9.8 | 5.5 | 59 |
202 | 4 | High | 25 | Ar | 0 | 0.924 E+05 | 1.00 E+07 | 5.3 | 2.4 | 0 |
203 | 4 | High | 25 | Ar | 0 | 0.945 E+05 | 1.00 E+07 | 5.3 | 3.3 | 1 |
204 | 4 | High | 25 | Ar | 0 | 0.956 E+05 | 1.00 E+07 | 5.3 | 5.5 | 2 |
288 | 4 | High | 25 | O | 0 | 1.059 E+05 | 1.00 E+07 | 1.0 | 2.4 | 0 |
289 | 4 | High | 25 | O | 0 | 1.069 E+05 | 1.00 E+07 | 1.0 | 3.3 | 0 |
290 | 4 | High | 25 | O | 0 | 1.081 E+05 | 1.00 E+07 | 1.0 | 5.5 | 0 |
RUN # | DUT | Output Condition | TEMPERATURE (°C) | ION | ANGLE | FLUX (ions·cm2/mg) | FLUENCE (# ions) | LETEFF (MeV.cm2/mg) | Vs = VCC - VEE | # of Events |
---|---|---|---|---|---|---|---|---|---|---|
35 | 4 | Low | 25 | Xe | 0 | 1.019 E+05 | 1.00 E+07 | 50.5 | 2.4 | 93 |
36 | 4 | Low | 25 | Xe | 0 | 1.025 E+05 | 1.00 E+07 | 50.5 | 3.3 | 102 |
37 | 4 | Low | 25 | Xe | 0 | 1.019 E+05 | 1.00 E+07 | 50.5 | 5.5 | 303 |
117 | 4 | Low | 25 | Kr | 0 | 1.045 E+05 | 1.00 E+07 | 35.6 | 2.4 | 61 |
118 | 4 | Low | 25 | Kr | 0 | 1.039 E+05 | 1.00 E+07 | 35.6 | 3.3 | 69 |
119 | 4 | Low | 25 | Kr | 0 | 1.051 E+05 | 1.00 E+07 | 35.6 | 5.5 | 170 |
177 | 4 | Low | 25 | Kr | 0 | 1.039 E+05 | 1.00 E+07 | 23.1 | 2.4 | 34 |
178 | 4 | Low | 25 | Kr | 0 | 1.011 E+05 | 1.00 E+07 | 23.1 | 3.3 | 48 |
179 | 4 | Low | 25 | Kr | 0 | 0.992 E+05 | 1.00 E+07 | 23.1 | 5.5 | 70 |
195 | 4 | Low | 25 | Ar | 0 | 0.978 E+05 | 1.00 E+07 | 9.8 | 2.4 | 0 |
196 | 4 | Low | 25 | Ar | 0 | 0.981 E+05 | 1.00 E+07 | 9.8 | 3.3 | 2 |
197 | 4 | Low | 25 | Ar | 0 | 0.980 E+05 | 1.00 E+07 | 9.8 | 5.5 | 2 |
198 | 4 | Low | 25 | Ar | 0 | 0.973 E+05 | 1.00 E+07 | 5.3 | 2.4 | 0 |
199 | 4 | Low | 25 | Ar | 0 | 0.945 E+05 | 1.00 E+07 | 5.3 | 3.3 | 0 |
200 | 4 | Low | 25 | Ar | 0 | 0.934 E+05 | 1.00 E+07 | 5.3 | 5.5 | 0 |
291 | 4 | Low | 25 | O | 0 | 1.079 E+05 | 1.00 E+07 | 1.0 | 2.4 | 0 |
292 | 4 | Low | 25 | O | 0 | 1.065 E+05 | 1.00 E+07 | 1.0 | 3.3 | 0 |
293 | 4 | Low | 25 | O | 0 | 1.069 E+05 | 1.00 E+07 | 1.0 | 5.5 | 0 |
Weibull-Fit and cross section plots for the TLV1H103-SEP at supply voltages of 2.4V, 3.3V, and 5.5V are shown in the figures below respectively. For each of the supply voltages, the total number of transients (both output high and output low combined) and the run fluences are used to calculate the mean (σMEAN), upper bound (σUB), and lower bound (σLB) cross section (as discussed in Appendix C) at 95% confidence interval. The Weibull equation used for the fit is presented in Equation 1, and parameters are shown in Table 6-10.
LETEFF(MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 93 | 7.51E-06 | 9.3E-06 | 8.85E-06 | 4.49E-07 | 2.01E-13 | 1.14E-05 | 2.09E-06 | 1.79E-06 |
35.6 | Kr | 1.00E+07 | 61 | 4.67E-06 | 6.1E-06 | 6.4E-06 | -2.96E-07 | 8.78E-14 | 7.84E-06 | 1.74E-06 | 1.43E-06 |
23.1 | Kr | 1.00E+07 | 34 | 2.35E-06 | 3.4E-06 | 2.34E-06 | 1.06E-06 | 1.13E-12 | 4.75E-06 | 1.35E-06 | 1.05E-06 |
9.8 | Ar | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
5.3 | Ar | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Energy (MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 178 | 1.53E-05 | 1.78E-05 | 1.65E-05 | 1.28E-06 | 1.65E-12 | 2.06E-05 | 2.82E-06 | 2.52E-06 |
35.6 | Kr | 1.00E+07 | 81 | 6.43E-06 | 8.1E-06 | 1.03E-05 | -2.15E-06 | 4.64E-12 | 1.01E-05 | 1.97E-06 | 1.67E-06 |
23.1 | Kr | 1.00E+07 | 39 | 2.77E-06 | 3.9E-06 | 3.13E-06 | 7.68E-07 | 5.90E-13 | 5.33E-06 | 1.43E-06 | 1.13E-06 |
9.8 | Ar | 1.00E+07 | 13 | 1.07E-06 | 1.80E-06 | 7.31E-08 | 1.73E-06 | 2.98E-12 | 2.84E-06 | 1.04E-06 | 7.33E-07 |
5.3 | Ar | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Energy (MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 102 | 8.32E-06 | 1.02E-05 | 9.85E-06 | 3.49E-07 | 1.22E-13 | 1.24E-05 | 2.18E-6 | 1.88E-06 |
35.6 | Kr | 1.00E+07 | 69 | 5.37E-06 | 6.9E-06 | 7.69E-06 | -7.86E-07 | 6.17E-13 | 8.73E-06 | 1.83E-06 | 1.53E-06 |
23.1 | Kr | 1.00E+07 | 48 | 3.54E-06 | 4.80E-06 | 3.59E-06 | 1.21E-06 | 1.45E-12 | 6.36E-06 | 1.56E-06 | 1.26E-06 |
9.8 | Ar | 1.00E+07 | 2 | 2.42E-08 | 2.00E-07 | 2.13E-07 | -1.29E-08 | 1.66E-16 | 7.22E-07 | 5.22E-07 | 1.76E-07 |
5.3 | Ar | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Energy (MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 174 | 1.49E-05 | 1.74E-05 | 1.69E-05 | 5.27E-07 | 2.78E-13 | 2.02E-05 | 2.79E-06 | 2.49E-06 |
35.6 | Kr | 1.00E+07 | 132 | 1.10E-05 | 1.32E-05 | 1.32E-05 | -2.99E-08 | 8.92E-16 | 1.57E-05 | 2.45E-06 | 2.16E-06 |
23.1 | Kr | 1.00E+07 | 66 | 5.1E-06 | 6.60E-06 | 6.48E-06 | 1.21E-07 | 1.47E-14 | 8.40E-06 | 1.80E-06 | 1.50E-06 |
9.8 | Ar | 1.00E+07 | 18 | 1.07E-06 | 1.80E-06 | 7.92E-07 | 1.01E-06 | 1.02E-12 | 2.84E-06 | 1.04E-06 | 7.33E-07 |
5.3 | Ar | 1.00E+07 | 1 | 2.53E-09 | 1.00E-07 | 1.35E-07 | -3.48E-08 | 1.21E-15 | 5.57E-07 | 4.57E-07 | 9.75E-08 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Energy (MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 303 | 2.70E-05 | 3.03E_05 | 2.96E-05 | 7.40E-07 | 5.47E-13 | 3.39E-05 | 3.61E-06 | 3.32E-06 |
35.6 | Kr | 1.00E+07 | 170 | 1.45E-05 | 1.70E-05 | 1.95E-05 | -2.51E-06 | 6.29E-12 | 1.98E-05 | 2.76E-06 | 2.46E-06 |
23.1 | Kr | 1.00E+07 | 70 | 5.46E-06 | 7.00E-06 | 5.2E-06 | 1.80E-06 | 3.25E-12 | 8.84E-06 | 1.84E-06 | 1.54E-06 |
9.8 | Ar | 1.00E+07 | 2 | 2.42E-08 | 2.00E-07 | 6.99E-08 | 1.30E-07 | 1.69E-14 | 7.22E-07 | 5.22E-07 | 1.76E-07 |
5.3 | Ar | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Energy (MeV-cm2 /mg) | Ion | Fluence (Ions/cm2) | Total Events | σLB (cm2/ Device) | σMEAN (cm2/ Device) | FIT | Residual | Residual2 | σUB (cm2/ Device) | UB Error | LB Error |
---|---|---|---|---|---|---|---|---|---|---|---|
50.5 | Xe | 1.00E+07 | 329 | 2.94E-05 | 3.29E-05 | 3.16E-05 | 1.31E-06 | 1.72E-12 | 3.67E-05 | 3.75E-06 | 3.46E-06 |
35.6 | Kr | 1.00E+07 | 238 | 2.09E-05 | 2.38E-05 | 2.41E-05 | -2.77E-07 | 7.66E-14 | 2.70E-05 | 3.22E-06 | 2.93E-06 |
23.1 | Kr | 1.00E+07 | 95 | 7.69E-06 | 9.50E-06 | 1.15E-05 | -1.98E-06 | 3.92E-12 | 1.16E-05 | 2.11E-06 | 1.81E-06 |
9.8 | Ar | 1.00E+07 | 59 | 4.49E-06 | 5.90E-06 | 1.38E-06 | 4.52E-06 | 2.04E-11 | 7.61E-06 | 1.71E-06 | 1.41E-06 |
5.3 | Ar | 1.00E+07 | 2 | 2.42E-08 | 2.00E-07 | 2.35E-07 | -3.49E-08 | 1.22E-15 | 7.22E-07 | 5.22E-07 | 1.76E-07 |
1.0 | O | 1.00E+07 | 0 | 0 | 0 | 0 | 0 | 0 | 3.69E-07 | 3.69E-07 | 0 |
Parameters | Value for 2.4V Supply, Output Low | Value for 2.4V Supply, Output High | Value for 3.3V Supply, Output Low | Value for 3.3 V Supply, Output High | Value for 5.5V Supply, Output Low | Value for 5.5V Supply, Output High |
---|---|---|---|---|---|---|
σSAT (cm2) | 9.30E-06 | 1.78E-05 | 1.02E-05 | 1.74E-05 | 3.03E-05 | 3.29E-05 |
Onset (MeV-cm2 /mg) | 9.8 | 5.3 | 5.3 | 1 | 5.3 | 1 |
w | 24 | 32 | 26 | 30 | 30 | 31 |
s | 2.1 | 2.8 | 2.2 | 2.5 | 3.2 | 2.5 |
Sum (Residual2) | 1.42E-12 | 8.38E-12 | 2.19E-12 | 1.31E-12 | 1.01E-11 | 2.61E-11 |