SLUAA93 November 2020 UCC28730-Q1
The failure mode distribution estimation for UCC28730-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| DRV stuck low | 34 |
| DRV stuck high | 20 |
| Incorrect Vout regulation | 17 |
| No effect | 29 |