SLUK023A February   2019  – June 2024 UC1825B-SP

 

  1.   1
  2.   UC1825B-SP total ionizing dose (TID) radiation report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Conditions
  6. 3TID Characterization Results
    1. 3.1 Device Spec Table
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   LDR TID Report
  9.   B Revision History

Abstract

This report discusses the results of the Total Ionizing Dose (TID) testing for the QML Class V certified Texas Instruments (TI) UC1825B-SP (596R876806VYC).

The study helps determine the TID effects under low dose rate (LDR) up to 100krad(Si). The results show that all samples are fully functional after being exposed up to 100krad(Si).
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