SLUSAM9E July 2011 – April 2020
PRODUCTION DATA.
The cell-voltage monitoring circuits include an input level-shifter, multiplexer (MUX), and scaling amplifier. The Host selects one VCn cell input for measurement by setting the VCOUT_SEL and CELL_SEL bits in the CELL_CTL register. The scaling factor is set by the REF_SEL bit in the CONFIG_2 register. The selected cell input is level shifted to VSS reference, scaled by a nominal gain GVCOUT = 0.3 (REF_SEL = 0) or 0.6 (REF_SEL = 1) and output on the VCOUT pin for measurement by the Host ADC.
Similar to the reference voltage, gain and offset correction factors are determined at final test for each individual cell input and stored in non-volatile registers VCn_CAL (n = 1-6) and VC_CAL_EXT_m (m = 1-2). These factors are read by the Host and applied to the ADC voltage-measurement results in order to obtain the specified accuracy.
The cell voltage offset and gain correction factors are stored as 5-bit signed integers in 2’s complement format. The most significant bits (VCn_OC_4, VCn_GC_4) are stored separately and must be concatenated with the least significant bits (VCn_OFFSET_CORR, VCn_GAIN_CORR).
The reference voltage offset and gain correction factors are stored respectively as a 6-bit and 5-bit signed integer in 2’s complement format. As with the cell voltage correction factors, the most significant bits (VREF_OC_5, VREF_OC_4, VREF_GC_4) are stored separately and must be concatenated with the least significant bits (VREF_OFFSET_CORR, VREF_GAIN_CORR).
The actual cell voltage (VCn) is calculated from the measured voltage (VCOUT) as shown in the following equations: