SLUUBY1B December 2020 – April 2022 BQ76942
| Class | Subclass | Name | Type | Min | Max | Default | Unit |
|---|---|---|---|---|---|---|---|
| Settings | Configuration | Power Config | H2 | 0x0000 | 0xFFFF | 0x2982 | Hex |
| 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
| RSVD_0 | RSVD_0 | DPSLP_OT | SHUT_TS2 | DPSLP_PD | DPSLP_LDO | DPSLP_LFO | SLEEP |
| 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
| OTSD | FASTADC | CB_LOOP_SLOW_1 | CB_LOOP_SLOW_0 | LOOP_SLOW_1 | LOOP_SLOW_0 | WK_SPD_1 | WK_SPD_0 |
| Bit | Field | Default | Description |
|---|---|---|---|
| 13 | DPSLP_OT | 1 | Enables transition from DEEPSLEEP to SHUTDOWN based on on-chip
over-temperature detection. 0 = In DEEPSLEEP, on-chip OT is disabled 1 = On-chip OT is enabled in DEEPSLEEP, allowing transition to SHUTDOWN |
| 12 | SHUT_TS2 | 0 | When TS2 is used as a thermistor or has some other external
pulldown, SHUTDOWN mode cannot be used. If TS2 is externally pulled
down, this bit should be set to prevent the device from immediately
exiting SHUTDOWN mode in some circumstances. When this bit is set
and SHUTDOWN conditions are met, the device will instead enter a low
power state waiting for a rising edge on the LD pin. 0 = Standard SHUTDOWN mode behavior is selected 1 = SHUTDOWN mode replaced by low-power state waiting for rising edge on LD pin |
| 11 | DPSLP_PD | 1 | Enables wake from DEEPSLEEP based on charger attach. When clear,
DEEPSLEEP mode must be exited via host command. 0 = DEEPSLEEP not exited on rising edge on LD pin 1 = A rising edge on the LD pin exits DEEPSLEEP |
| 10 | DPSLP_LDO | 0 | Determines whether or not REG1 and REG2 are disabled in DEEPSLEEP
mode 0 = Disable REG1 and REG2 when entering DEEPSLEEP mode 1 = Leave REG1 and REG2 in present state when entering DEEPSLEEP |
| 9 | DPSLP_LFO | 0 | Determines whether or not to disable the Low Frequency Oscillator
in DEEPSLEEP mode to conserve power. 0 = Disable the Low Frequency Oscillator in DEEPSLEEP mode (recommended) 1 = Enable the Low Frequency Oscillator in DEEPSLEEP mode |
| 8 | SLEEP | 1 | Sets the default value of BatteryStatus()[SLEEP_EN] which
enables or disables SLEEP mode. After initialization, SLEEP_EN can
stil be changed via the SLEEP_ENABLE and SLEEP_DISABLE
subcommands. 0 = Disable SLEEP mode by default 1 = Enable SLEEP mode by default |
| 7 | OTSD | 1 | Enables or disables the on-chip over-temperature detection
circuit to shut down the device in case of a severe on-chip
over-temperature condition. 0 = Disable SHUTDOWN from on-chip over-temperature detection circuit (not recommended) 1 = Enter SHUTDOWN mode when on-chip over-temperature condition is detected |
| 6 | FASTADC | 0 | Selects ADC conversion speed for voltage and simultaneous current
measurements. Higher speed results in lower accuracy. 0 = 3 ms per conversion 1 = 1.5 ms per conversion |
| 5–4 | CB_LOOP_SLOW_1–CB_LOOP_SLOW_0 | 0 | Selects ADC scan loop speed while cell balancing is active by
inserting current-only measurements after each voltage and
temperature scan loop. This can be used to slow down voltage
measurements while balancing to increase the duty-cycle, since
balancing must be paused during measurement of the cell. 0 = Full speed 1 = Half speed 2 = Quarter speed 3 = Eighth speed |
| 3–2 | LOOP_SLOW_1–LOOP_SLOW_0 | 0 | Selects normal ADC scan loop speed by inserting current-only
measurements after each voltage and temperature scan loop. This
setting is used while cell balancing is not active. 0 = Full speed 1 = Half speed 2 = Quarter speed 3 = Eighth speed |
| 1–0 | WK_SPD_1–WK_SPD_0 | 2 |
Selects coulomb counter conversion speed used in SLEEP mode for the current wake comparator function. Slower conversion speed results in lower noise. Setting 0x2 may exhibit a large offset and should be avoided. Setting 0x3 results in ~100μV (1-sigma) noise level, so should only be used when the Wake Comparator Current is set to a level such that |VSRP - VSRN| > 1000μV. 0x0 = 48 ms conversion rate 0x1 = 24 ms conversion rate 0x2 = 12 ms conversion rate 0x3 = 6 ms conversion rate |