The BQ769142 device integrates the capability to measure its internal die temperature by digitizing an internal transistor base-emitter voltage. This voltage is measured periodically as part of the measurement loop and is processed to provide a temperature value using the 0x68 Int Temperature() command.

This internal temperature measurement can be used for cell temperature protections and logic that uses minimum, maximum, or average cell temperature by setting the Settings:Configuration:DA Configuration[TINT_EN] configuration bit and keeping the Settings:Configuration:DA Configuration[TINT_FETT] bit cleared. The internal temperature measurement can instead be used for FET temperature by setting both Settings:Configuration:DA Configuration[TINT_EN] and Settings:Configuration:DA Configuration[TINT_FETT], although in this case it will not be used for cell temperature.

The calculation of temperature is performed as follows:

Internal Temperature (in units of 0.1 K) = (ADC value) × Calibration:Internal Temp Model:Int Gain / 65536 + Calibration:Internal Temp Model:Int base offset + Calibration:Temperature:Internal Temp Offset

except if (ADC value) > Calibration:Internal Temp Model:Int Maximum AD, then the reported internal temperature is calculated using the Calibration:Internal Temp Model:Int Maximum AD as the ADC value. If internal temperature is calculated > Calibration:Internal Temp Model:Int Maximum Temp, the reported internal temperature is set to Calibration:Internal Temp Model:Int Maximum Temp.