3 Test Device and Evaluation Board Information

The TPS7H2201-SP is packaged in a 16-pin thermally-enhanced dual ceramic flat pack package (HKH) as shown in Figure 3-1. The TPS7H2201EVM-CVAL evaluation board was used to evaluate the performance and characteristics of the TPS7H2201-SP under heavy-ions. Figure 3-2 shows the top and bottom views of the evaluation board used for the radiation testing. Figure 3-3 shows the board schematics. See the TPS7H2201-SP Single Evaluation Module for more information about the evaluation board.

The package lid was removed to reveal the die face for all heavy ions testing

Figure 3-1 Photograph of Delidded TPS7H2201-SP (Left) and Pin Out Diagram (Right)

Figure 3-2 TPS7H2201-SP Board Top View (Left) and Bottom-View (Right)

R2, R3, C14, and C16 are populated components on the TPS7H2201EVM-CVAL, however, the components were removed and all boards used for the characterization discussed in this report had the switch closed during most of the SEE characterization.

Figure 3-3 Schematics of the TPS7H2201EVM-CVAL Used for the Heavy-ion Testing