Abstract

The purpose of this study was to characterize the single-event effect (SEE) performance due to heavy-ion irradiation of the TPS7H2201-SP. Heavy-ions were used to irradiate six devices in 14 runs with a flux of approximately 10⁵ ions / cm² × s and fluence of approximately 10⁷ ions / cm². The results demonstrate that the TPS7H2201-SP is SEL, SEB, SEGR, SET, and SEFI free up to LET_EFF = 75 MeV·cm²/mg (at 125°C for SEL and 25°C for SET, SEB, SEGR, and SEFI), and across the full electrical specifications. This report uses the QMLV TPS7H2201-SP device in a ceramic package. It is also applicable for the QMLP TPS7H2201-SP device in a plastic package which uses the same die as the QMLV device.