SLVAE32B August   2018  – December 2023 TPS7H2201-SP

1.   1
2.   Abstract
3.   Trademarks
4. 1 Device Overview
5. 2 Single-Event Effects
6. 3 Test Device and Evaluation Board Information
7. 4 Depth, Range, and LETEFF Calculation
8. 5 Irradiation Facility and Setup
9. 6 Test Setup and Procedures
10. 7 Single-Event-Latchup (SEL), Single-Event-Burnout (SEB), and Single-Event-Gate-Rupture (SEGR)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR)
11. 8 Single Event Transient (SET)
12. 9 Total Ionizing Dose From SEE Experiments
13. 10Orbital Environment Estimations
14. 11Confidence Interval Calculations
    1. 11.1 Rate Orbit Calculation
15. 12Summary
16. 13References
17. 14Revision History