SLVAEY4A november 2021 – april 2023 TPSI3050-Q1
The failure mode distribution for TPSI3050-Q1 in Table 4-2 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VDDH/VDDM rails fail to power up. VDRV remains low. | 15% |
| VDRV does not respond to EN signaling. | 20% |
| Output power not meeting specification. Longer VDDH/VDDM start-up and recovery times. | 25% |
| VDDH not regulated, potential device damage | 15% |
| VDRV propagation times longer than specified | 5% |
| VDRV only stays high for few microseconds due to improper loading of configuration. | 5% |
| Higher EMI | 5% |
| Unpredictable power down sequence | 5% |
| VDRV output held high | 5% |