SLVK099B March   2022  – September 2023 TPS7H5001-SP , TPS7H5002-SP , TPS7H5003-SP , TPS7H5004-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 System Level Implications
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References
  16.   C Revision History

A Total Ionizing Dose from SEE Experiments

The production TPS7H500x-SP is rated to a total ionizing dose (TID) of 100 krad(Si). In the course of the SEE testing, the heavy-ion exposures delivered ≈10 krad(Si) per 107 ions/cm2 run. The cumulative TID exposure was controlled below 100krad (Si) per unit. All ten TPS7H500x-SP devices used in the studies described in this report stayed within specification and were fully-functional after the heavy-ion SEE testing was completed.
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