Abstract

The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the TPS7H500x-SP. Destructive single-event-effects (DSEE) performance was verified at the maximum recommended voltage of 14 V. SET performance was verified over a variety of different operating conditions including: internal and external clock, F_SW = 1 and 2 MHz, error amp (in unity gain), and cross conduction. For the transient characterization, input voltages of 4, 12, and 14 V were used (For TPS7H5002/3/4- SP only a nominal VIN of 12 V was used). Heavy-ions with LET_EFF of 30.5 to 75 MeV·cm²/mg were used during the validation. A total of 11 devices were used for the data collection. Flux of ≈10⁵ ions/cm2·s and fluences of ≈10⁷ ions/cm² per run were used for the characterization. The results demonstrated that the TPS7H500x-SP is SEL and SEB/SEGR free up to 75 MeV·cm²/mg, at T = 125°C and T = 25°C, respectively, and across the full electrical specifications. SET characterization is presented and discussed for a variety of different operating conditions. This report uses the QMLV TPS7H500X-SP device in a ceramic package. The report is also applicable for the QMLP TPS7H500X-SP device in a plastic package which uses the same die as the QMLV device.