Abstract

This report discusses the results of the total-ionizing dose (TID) testing for the Texas Instruments TPS7H4001-SP is a Radiation Hardness Assured, 7-V, 18-A, synchronous buck converter with integrated low-resistance, high-side and low-side MOSFETs in a thermally enhanced 44-pin Space Enhanced Plastic (Space EP) package.

The study was done to determine TID effects under l high dose rate (HDR) up to 100 krad(Si). The results show that all samples passed within the specified limits up to 100 krad(Si).