SLVK145 august 2023 TPS7H2201-SEP
PRODUCTION DATA
- 1
- Single-Event Effects Test Report of the TPS7H2201-SEP eFuse
- Trademarks
- 1 Introduction
- 2 Single-Event Effects
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The TPS7H2201-SEP is packaged in a 32-pin (HTSSOP) plastic package as shown in Figure 3-1. A TPS7H2201EVM evaluation board was used to evaluate the performance and characteristics of the TPS7H2201-SEP under heavy-ions.
Figure 3-2 shows the top view of the evaluation board used for the radiation testing. Figure 3-3 shows the EVM board schematics for dual site testing. For more information about the evaluation board, see the TPS7H2201-SEP Evaluation Module User's Guide.
The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-1 Photograph of Delidded
TPS7H2201-SEP (Left) and Pin Out Diagram (Right)
Figure 3-2 TPS7H2201-SEP Board Top
View
Figure 3-3 TPS7H2201-SP EVM
Schematic