Abstract

The purpose of this study is to characterize the Single-Event-Effects (SEE) performance due to heavy-ion irradiation of the TPS7H2201-SEP. Heavy-ions with LET_EFF (Effective Linear Energy Transfer) of 48 MeV·cm²/mg were used to irradiate 5 devices. A flux of ≈ 10⁵ ions/(cm²·s) and fluence of ≈ 10⁷ ions/cm² per run were used for the characterization. The results demonstrated that the TPS7H2201-SEP is Single Event Latch-Up, Single-Event-Burnout/Single-Event-Gate-Rupture (EN = High)-free at T = 125°C and 25°C, respectively, using ¹⁰⁹Ag across the full electrical specifications. The device is Single-Event-Burnout/Single-Event-Gate-Rupture (EN = Low)-free up to V_IN = 7V. Not a single Transient was observed from V_IN of 1.5 to 7 V at LEF_EFF ≤ 48 MeV∙cm²/mg. Refer to the SET section for more details.