SLVK148B August 2023 – September 2023 TPS7H2211-SEP
PRODUCTION DATA
HDR devices were stressed at 20 krad(Si), 30 krad(Si) and 50 krad(Si) for biased and unbiased conditions.
Total Samples: 15 | ||
---|---|---|
Exposure Levels | ||
20 krad(Si) | 30 krad(Si) | 50 krad(Si) |
6, 7, 8, 9, 10 | 16, 17, 18, 19, 20 | 26, 27, 28, 29, 30 |
Total Samples: 15 | ||
---|---|---|
Exposure Levels | ||
20 krad(Si) | 30 krad(Si) | 50 krad(Si) |
1, 2, 3, 4, 5 | 11, 12, 13, 14, 15 | 21, 22, 23, 24, 25 |