Abstract

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance Arm® Cortex®-R-based MCUs. The TMS570LC4357-SEP device features on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP is manufactured with a controlled baseline and features the following:

• One assembly and test site
• Product traceability
• An extended product life cycle