6 Test Setup and Procedures

There were four input supplies used to provide power to the TPS7H3014-SP. The voltage values and the model of the used equipment per the SEE test type is presented in Table 6-1.

As discussed in Section 3 the TPS7H3014-SP was tested (or evaluated) under heavy-ions using three unique configurations.

1. For DSEE the device was tested under the configuration shown in Figure 3-3. We refer to this configuration as the loopback ⁽¹⁾. ENx was tied to SENSEx using a resistive divider with R_TOP = 100kΩ and R_BOTTOM = 21kΩ. Under this configuration the overdrive ⁽¹⁾ voltage is 1V (typically).

2. For SET the device was tested with DLY_TMR disabled (OPEN). Each SENSE_X was connected to an external power supply via a resistive divider with R_TOP = 24.5kΩ and R_BOTTOM = 1.5kΩ. Under this configuration the external voltage was controlled to provide an overdrive voltage of ±20mV (typically). The device was tested under:

   1. Waiting to Sequence UP State (with a –20mV by forcing V_OUTx to 6.27V).
   2. Waiting to Sequence DOWN State (with a +20mV by forcing V_OUTx to 6.19V).

Transients were monitored on EN1, EN4, and FAULT. The equipment used and the trigger details are summarized in Table 6-2. The device was tested for transients under the Waiting to Sequence UP and Waiting to Sequence DOWN states. This was done to ensure the device will not activate/deactivate any downstream device (typically a POL) connected to it.

Figure 6-1 shows a block diagram of the setup used for SEE testing of the TPS7H3014-SP.

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to ensure that the test system was stable under all bias and load conditions prior to being taken to the TAMU facility. During the heavy-ion testing, the LabVIEW control program powered up the TPS7H3014-SP device and set the external sourcing and monitoring functions of the external equipment. After functionality and stability was confirmed, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved (determined by external detectors and counters). During irradiation, the NI scope cards continuously monitored the signals. When the output exceeded the pre-defined 20% edge trigger, a data capture was initiated. No sudden increases in current were observed (outside of normal fluctuations) on any of the test runs and indicated that no SEL or SEB/SEGR events occurred during any of the tests. Neither, a single transient was capture by the oscilloscope measuring the outputs indicting the device is SET-free.

Figure 6-1 Block Diagram of the SEE Test Setup for the TPS7H3014-SP