SLVK172 June   2024 TPS7H3014-SP

 

  1.   1
  2.   TPS7H3014-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A References

Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H3014-SP. Heavy-ions with LETEFF = 75MeV·cm2/mg were used for the SEE characterization campaign. Flux of ≈1 × 104 to ≈9 × 104 ions/cm2·s and fluences of ≈107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H3014-SP is free of destructive SEL and SEB/SEGR. The device also shown to be SET free at LETEFF = 75MeV·cm2/mg and across the full electrical specifications. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE and SET are presented for reference.