SLVK173 July 2024 TPS7H4011-SP
SETs are defined as heavy-ion-induced transients upsets on the VOUT, SS_TR, or PWRGD of the TPS7H4011-SP.
Testing was performed at room temperature (no external temperature control applied). The heavy-ion species used for the SET testing was Homium (165Ho) for an LETEFF = 75MeV × cm2/ mg, for more details refer to Ion LETEFF, Depth, and Range in Silicon. Flux of approximately 5 × 104 ions/cm2× s and a fluence of 1 × 107 ions/cm2, per run were used for the SET's characterization discussed on this chapter. Over the course of testing four devices, not a single transient or SEFI was recorded on any of the monitored signals indicating that the TPS7H4011-SP is SET/SEFI free up to LETEFF = 75MeV × cm2/ mg.
Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.
| Scope Model | Trigger Signal | Trigger Type | Trigger Value | Record Length | Sample Rate |
|---|---|---|---|---|---|
| MSO58B | VOUT | Window | ± 3 % | 20μs/div | 250MS/s |
| PXIe-5172 (1) | SS_TR | Edge/Negative | 20% | 20k | 100MS/s |
| PXIe-5172 (2) | PWRGD | Edge/Negative | 0.5-V Below nominal | 20k | 100MS/s |
| Run Number | Unit Number | ION | LETEFF (MeV × cm2/mg) | VIN (V) | FLUX (ions × cm2/mg) | Fluence (Number ions) | MSO58B VOUT Number ≥ 3% | PXIe-5172 SS_TR Number | PXIe-5172 PWRGD Number |
|---|---|---|---|---|---|---|---|---|---|
| 13 | 1 | 165Ho | 75 | 12 | 3.18 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 14 | 1 | 165Ho | 75 | 5 | 3.11 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 15 | 2 | 165Ho | 75 | 12 | 5.65 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 16 | 2 | 165Ho | 75 | 5 | 5.47 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 17 | 3 | 165Ho | 75 | 12 | 6.01 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 18 | 3 | 165Ho | 75 | 5 | 6.25 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 19 | 4 | 165Ho | 75 | 12 | 6.84 × 104 | 1.00 × 107 | 0 | 0 | 0 |
| 20 | 4 | 165Ho | 75 | 5 | 6.94 × 104 | 1.00 × 107 | 0 | 0 | 0 |