SLVK173 July 2024 TPS7H4011-SP
- 1
- TPS7H4011-SP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A Total Ionizing Dose from SEE Experiments
- B References
3 Device and Test Board Information
The TPS7H4011-SP is packaged in a 30-pin thermally-enhanced ceramic package as shown in Figure 3-1. The TPS7H4011-SP evaluation module (EVM)was used to evaluate the performance and characteristics of the TPS7H4011-SP under heavy ion radiation. The TPS7H4011EVM-CVAL EVM is shown in Figure 3-2. The EVM schematic is shown in Figure 3-3.
Figure 3-1 Photograph of Delidded TPS7H4011-SP (Left) and Pinout Diagram (Right)The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-2 TPS7H4011-SP EVM Top View. Jumper on J5 was populated, J6 was configured in the 2-3 position, J7 was configured in the 1-2 position, and J10 was configured in the 1-2 position for all testing
Figure 3-3 TPS7H4011-SP EVM Schematics