SLVK175 August 2024 TPS7H5002-SP
HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), and 100 krad(Si) for biased and unbiased conditions.
Total Samples: 25 | ||||
---|---|---|---|---|
Exposure Levels | ||||
3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
6, 7, 8, 9, 10 | 16, 17, 19, 20, 21 | 27, 28, 29, 30, 31 | 37, 38, 39, 40, 41 | 47, 48, 49, 50, 51 |
Total Samples: 25 | ||||
---|---|---|---|---|
Exposure Levels | ||||
3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
1, 2, 3, 4, 5 | 11, 12, 13, 14, 15 | 22, 23, 24, 25, 26 | 32, 33, 34, 35, 36 | 42, 43, 44, 45, 46 |