Process variation for a given parameter is represented by its mean and tolerance values, which have been given default values based on statistical design simulations that are run at room temperature (27°C) and encompass variation caused by input voltage. If desired, the user may alter these values.

The influence of temperature and load on the listed device parameters is provided by nominal-case design simulations which exclude radiation and aging effects.

Radiation and aging effects are incorporated into the model in two ways. First, for the specified device parameters, the worst shifts observed between pre- and post-test measurements of approximately 50 units are determined for both TID testing and Life testing. The shifts associated with radiation and aging are applied independently to the mean parameter values in the model when it is set to simulate these conditions. If desired, users can incorporate similar shifts for non-modeled device parameters using Group C (Aging) and Group E (Radiation) reports. The model is also tuned so that the frequency response characteristics produced by simulations more closely match frequency response data collected using EVMs.

The EVM data used to tune the frequency response results of the TPS7H4001-SP WCA model was taken at two specific output voltages (1 V and 2.5 V) at 25°C using the default configuration seen on the 1-channel TPS7H4001-SP EVM, with the exception of changing the bottom feedback resistor to adjust the output voltage. Data collection was done using a total of 10 EVMs: three boards for High Dose Rate (HDR) TID testing, three boards for Low Dose Rate (LDR) TID testing, three boards for Life Test, and one control board.