SNAA345 December   2020 LMK5C33216

 

  1.   Trademarks
  2. Introduction
  3. Wander Generation
    1. 2.1 Wander Generation MTIE Option 1, G.8262 EEC Option 1
    2. 2.2 Wander Generation TDEV G.8262 EEC Option 1
    3. 2.3 Wander Generation MTIE Stratum ITU-T G.8262 EEC Option 2
    4. 2.4 Wander Generation TDEV G.8262 EEC Option 2
  4. Wander Transfer
    1. 3.1 Transfer Function of the PLL for Option 1 and Option 2
    2. 3.2 Wander Transfer TDEV G.8262 Option 2
  5. Wander Tolerance
    1. 4.1 Wander Tolerance G.8262 Option 1
    2. 4.2 Wander Tolerance G.8262 Option 2
  6. Jitter Tolerance
    1. 5.1 Jitter Tolerance G.8262 Option 1 and Option 2
  7. Phase Transient Generation
    1. 6.1 Short-Term Phase Transient Response G.8262 Option 1
    2. 6.2 Short-Term Phase Transient Response G.8262 Option 2
    3. 6.3 Phase Transient Generation With Signal Interruptions G.8262 EEC Option 1
    4. 6.4 Phase Discontinuity G.8262 Option 1
    5. 6.5 Phase Discontinuity G.8262 Option 2
  8. Holdover
    1. 7.1 Holdover G.8262 Option 1
    2. 7.2 Holdover G.8262 Option 2
  9. Free-Run Accuracy
    1. 8.1 Free-Run Accuracy G.8262 Option 1 and Option 2
  10. Pull-In and Hold-In
    1. 9.1 Pull-In Range G.8262 Option 1 and Option 2
  11. 10Conclusion
  12. 11References

Jitter Tolerance G.8262 Option 1 and Option 2

A PLL that is locked to an input clock must be able to tolerate the jitter defined in figure 9 in the G.8262 specification and figure 10 in the G.8262 specification. The definition of tolerance is that the device will not trigger any alarms while locked to such an input clock and that it will be able to pull-in to such an input clock. For Option 1, LMK5C33216 DPLL loop bandwidth was set to 10 Hz. For Option 2, the DPLL loop bandwidth was set to 0.1 Hz. For this test, the modulation frequency and frequency deviation was applied on the E4437B.

In compliance with the jitter tolerance specification requirement, the reference clock to LMK5C33216 (generated using E4437B) was modulated. The LMK5C33216 met the jitter tolerance requirements per the standard. The LMK5C33216 did not trigger any alarms, stayed locked to the reference and there was no observed degradation to the integrated RMS (12 kHz to 20 MHz) phase jitter of the output clock (156.25 MHz). The integrated RMS phase jitter was < 250 fs (max) for the duration for this test.

Table 5-1 1G Synchronous Ethernet Wideband Jitter Tolerance for EEC-Option 1 & EEC-Option 2(1)
PEAK-TO-PEAK JITTER AMPLITUDE (UI)FREQUENCY f (Hz)
312.510 < f ≤ 12.1
3750 f-112.1 < f ≤ 2.5k
1.52.5k < f ≤ 50k
1G includes 1000BASE-KX, -SX, -LX; multi-lane interfaces are for further study.
Table 5-2 10G Synchronous Ethernet Wideband Jitter Tolerance for EEC-Option 1 and
EEC-Option 2(1)
PEAK-TO-PEAK JITTER AMPLITUDE (UI)FREQUENCY f (Hz)
248810 < f ≤ 12.1
3000 f-112.1 < f ≤ 20k
1.520k < f ≤ 40k
10G includes 10GBASE-SR/LR/ER, 10GBASE-LRM, 10GBASE-SW/LW/EW and multi-lane interfaces consisting of 10G lanes including 40GBASE-KR4/CR4/SR4/LR4 and 100GBASE-CR10/SR10.
Table 5-3 25G Synchronous Ethernet Wideband Jitter Tolerance for EEC-Option 1 and
EEC-Option 2(1)
PEAK-TO-PEAK JITTER AMPLITUDE (UI)FREQUENCY f (Hz)
644510 < f ≤ 11.17
72000 f-111.17 < f ≤ 20k
3.620k < f ≤ 100k
25G includes multi-lane interfaces consisting of 25G lanes including 100GBASE-LR4/ER4.
Table 5-4 1G Test Conditions
MOD FREQUENCY (Hz)PEAK-TO-PEAK PHASE AMPLITUDE (UI)FREQ DEVIATION (kHz)
10312.50.245
12.1312.50.297
100400.314
100040.314
25001.50.295
100001.51.178
500001.55.890
Table 5-5 10G Test Conditions
MOD FREQUENCY (Hz)PEAK-TO-PEAK PHASE AMPLITUDE (UI)FREQ DEVIATION (kHz)
1024880.195
12.124880.236
1003000.236
1000300.236
2500120.236
200001.5

0.236

400001.5

0.471

Table 5-6 25G Test Conditions
MOD FREQUENCY (Hz)PEAK-TO-PEAK PHASE AMPLITUDE (UI)FREQ DEVIATION (kHz)
1064550.203
11.1764550.227
1007200.226
1000720.226
250028.80.226
200003.60.226
1000003.61.131