SNAA345 December   2020 LMK5C33216

 

  1.   Trademarks
  2. 1 Introduction
  3. 2 Wander Generation
    1. 2.1 Wander Generation MTIE Option 1, G.8262 EEC Option 1
    2. 2.2 Wander Generation TDEV G.8262 EEC Option 1
    3. 2.3 Wander Generation MTIE Stratum ITU-T G.8262 EEC Option 2
    4. 2.4 Wander Generation TDEV G.8262 EEC Option 2
  4. 3 Wander Transfer
    1. 3.1 Transfer Function of the PLL for Option 1 and Option 2
    2. 3.2 Wander Transfer TDEV G.8262 Option 2
  5. 4 Wander Tolerance
    1. 4.1 Wander Tolerance G.8262 Option 1
    2. 4.2 Wander Tolerance G.8262 Option 2
  6. 5 Jitter Tolerance
    1. 5.1 Jitter Tolerance G.8262 Option 1 and Option 2
  7. 6 Phase Transient Generation
    1. 6.1 Short-Term Phase Transient Response G.8262 Option 1
    2. 6.2 Short-Term Phase Transient Response G.8262 Option 2
    3. 6.3 Phase Transient Generation With Signal Interruptions G.8262 EEC Option 1
    4. 6.4 Phase Discontinuity G.8262 Option 1
    5. 6.5 Phase Discontinuity G.8262 Option 2
  8. 7 Holdover
    1. 7.1 Holdover G.8262 Option 1
    2. 7.2 Holdover G.8262 Option 2
  9. 8 Free-Run Accuracy
    1. 8.1 Free-Run Accuracy G.8262 Option 1 and Option 2
  10. 9 Pull-In and Hold-In
    1. 9.1 Pull-In Range G.8262 Option 1 and Option 2
  11. 10Conclusion
  12. 11References

6 Phase Transient Generation

The following EEC option 1 and 2 tests measure the short-term phase transient of the LMK5C33216. Figure 6-1 shows the setup used for these tests.

GUID-20201210-CA0I-DZMZ-J1D8-PXWX4D1ZDRKX-low.svgFigure 6-1 Test Setup for Phase Transient Generation
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