SNAK009A April   2022  – February 2024 ADC128S102-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Single-Event Latch-Up Results
  9. 6Summary
  10. 7Confidence Interval Calculations
  11. 8References
  12. 9Revision History

6 Summary

Radiation effects of the radiation-tolerant, eight-channel, 50kSPS to 1MSPS, 12-bit analog-to-digital converter, ADC128S102-SEP, was studied. This device passed a total dose rate of up to 30 krad(Si) and is latch-up immune up to LETEFF = 43MeV-cm2 / mg and T = 125°C.
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