SNAK009A April   2022  – February 2024 ADC128S102-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Single-Event Latch-Up Results
  9. 6Summary
  10. 7Confidence Interval Calculations
  11. 8References
  12. 9Revision History

Overview

The ADC128S102-SEP is a radiation-tolerant, eight-channel, 50kSPS to 1MSPS, 12-bit analog-to-digital converter. The device uses single-ended CMOS technology and an SPI or MICROWIRE™ (serial I/O) interface standard. The voltage range is from 2.7V to 5.25V for both supplies, VA and VD. The digital inputs are not prone to latch-up and can be asserted before the digital supply.

See the product page for more information.

Table 1-1 Overview Information(1)
DescriptionDevice Information
TI part number ADC128S102-SEP
MLS numberADC128S102PWTSEP
Device function Radiation-tolerant, eight-channel, 50kSPS to 1MSPS, 12-bit ADC
TechnologyCMOS7
Exposure facility Radiation Effects Facility, Cyclotron Institute,
Texas A&M University
Heavy ion fluence per run1 × 106 – 1 × 107 ions/cm2
Irradiation temperature 125°C (for SEL testing)
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