米6体育平台手机版

SNIK003 August 2022 TMP9R00-SP

Abstract
Trademarks
1Device Information
1. 1.1 Product Description
2. 1.2 Device Details
2Total Dose Test Setup
3Tested Parameters
4Total Ionizing Dose Characterization Test Results
1. 4.1 Total Ionizing Dose Characterization Summary Results
5References
A TID Reports

2.4 Test Configuration and Condition

HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), 75 krad(Si), 100 krad(Si). LDR devices were stressed at 30 krad(Si), 75 krad(Si), and 100 krad(Si) for biased and unbiased conditions.

Figure 2-1 Bias Diagram Used in TID Exposure

Table 2-1 HDR ≤ 50–100 rad(Si)/s Biased Device Information (HDR)

Exposure Levels
Total sample size : 54
3 krad(Si)	10 krad(Si)	30 krad(Si)	50 krad(Si)
1, 2, 3, 4, 5	1, 2, 3, 4, 5	1, 2, 3, 4, 5	1, 2, 3, 4, 5

Exposure Levels
75 krad(Si)		100 krad(Si)
1, 2, 3, 4, 5		11–32, 33–54

Table 2-2 LDR = 60 mrad(Si)/s Biased Exposure Information (LDR)

Total Sample Size: 16
Exposure Levels
50 krad(Si)	75 krad(Si)	100 krad(Si)
25a–30a	32a–37a	41a–44a