4 Revision History
Changes from H Revision (May 2019) to I Revision
- Deleted DQF from Device Information tableGo
- Deleted DQF package option Go
Changes from G Revision (November 2018) to H Revision
- Deleted the Thermal Pad from the DQF packageGo
- Changed VCC 0.3 To: VCC + 0.3 in the Absolute Maximum Ratings tableGo
- Added NOTE: "These parameters are specified by design."Go
Changes from F Revision (August 2018) to G Revision
- Changed the Pin image views Go
- Changed the Pin Descriptions format Go
Changes from E Revision (April 2013) to F Revision
- Added Applications list, Device Information table, ESD Ratings table, Device Functional Modes, Application and Implementation section, Layout section, Device and Documentation Support section.Go
- Added the DQF package to the data sheet Go
Changes from D Revision (April 2013) to E Revision
- Changed layout of National Data Sheet to TI formatGo