SNOAA62B February   2023  – October 2024 LMP7704-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6SET Results
  10. 7Extended Characterization
    1. 7.1 Correlation Test Results
    2. 7.2 Root Cause
    3. 7.3 SEL Prevention
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

Revision History

Changes from Revision A (Feb 2023) to Revision B (Oct 2024)

  • Added discussion of supply ESD clamp structure vulnerability in Abstract, SEE Mechanisms, and Summary Go
  • Added description of MSU FRIB facility in Irradiation Facility and Setup Go
  • Added Extended Characterization section and Correlation Test Results, Root Cause, and SEL Prevention subsectionsGo
  • Changed formatting of References section and added reference for the MSU FRIBGo

Changes from Revision * (February 14, 2023) to Revision A (February 24, 2023)

  • Added clarification of supply voltage conditions to Section 2.Go
  • Changed LMP7704-SP Bias Diagram in Section 3 to correct V- power supply label.Go
  • Changed LMP7704-SP SEL Conditions table in Section 5 to correct units for Flux and Fluence.Go
  • Changed SET Results tables in Section 6 to add units for Fluence.Go