SNOAA62B February   2023  – October 2024 LMP7704-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6SET Results
  10. 7Extended Characterization
    1. 7.1 Correlation Test Results
    2. 7.2 Root Cause
    3. 7.3 SEL Prevention
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

B References

  1. M. Shoga and D. Binder, "Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor Integrated Circuits", IEEE Trans. Nucl. Sci., Vol. 33(6), Dec. 1986, pp. 1714-1717.
  2. G. Bruguier and J. M. Palau, "Single particle-induced latchup", IEEE Trans. Nucl. Sci., Vol. 43(2), Mar. 1996, pp. 522-532.
  3. Texas A&M University. Texas A&M University Cyclotron Institute Radiation Effects Facility, webpage
  4. Ziegler, James F. The Stopping and Range of Ions in Matter, webpage.
  5. D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186-193.
  6. Vanderbilt University.ISDE CRÈME-MC, webpage.
  7. A. J. Tylka, J. H. Adams, P. R. Boberg, et al.,"CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code", IEEE Trans. on Nucl. Sci., Vol. 44(6), Dec. 1997, pp. 2150-2160.
  8. A. J. Tylka, W. F. Dietrich, and P. R. Boberg, "Probability distributions of high-energy solar-heavy-ion fluxes from IMP-8: 1973-1996", IEEE Trans. on Nucl. Sci.,Vol. 44(6), Dec. 1997, pp. 2140-2149.
  9. Michigan State University, MSU Facility for Rare Isotope Beams, webpage
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