SNOK005 October 2024 LMP7704-SP
The LMP7704-SP was subjected to a one-time characterization to determine the effects of Neutron Displacement Damage (NDD) to the device parameters. A sample size of twelve units was exposed to radiation testing per MIL-STD-883 (Method 1017 for Neutron Irradiation). The samples were dosed to exposure levels of 1 × 1012 n/cm2, 5 × 1012 n/cm2, and 1 × 1013 n/cm2, with three samples evaluated per exposure level. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for the device. All tested parameters remained within the data sheet specified limits. Degradation of input offset voltage on some samples was observed and is discussed herein.