米6体育平台手机版

SNVA966 July 2020 – MONTH LP8864-Q1 , LP8864S-Q1 , LP8866-Q1 , LP8866S-Q1

Trademarks
1Fault Handling Routine
2Different Fault and Diagnostic Handling Method Recommendation
1. 2.1 Different Fault Handling Method
2. 2.2 Different Diagnostic Wrong Information Handling Method
  1. 2.2.1 System-Level Critical Wrong Diagnostic Information
  2. 2.2.2 System Level Sustainable Wrong Diagnostic Information
3Summary
A Fault-Related Functions
1. A.1 Protection and Fault Detections
  1. A.1.1 Supply Faults
    1. A.1.1.1 VIN Undervoltage Faults (VINUVLO)
    2. 16
    3. A.1.1.2 VIN Overvoltage Faults (VINOVP)
    4. A.1.1.3 VDD Undervoltage Faults (VDDUVLO)
    5. A.1.1.4 VIN OCP Faults (VINOCP)
    6. A.1.1.5 Charge Pump Faults (CPCAP, CP)
    7. A.1.1.6 Boost Sync Clock Invalid Faults (BSTSYNC)
    8. A.1.1.7 CRC Error Faults (CRCERR)
  2. A.1.2 Boost Faults
  3. A.1.3 LED Faults
    1. A.1.3.1 Open LED Faults (OPEN_LED)
    2. A.1.3.2 Short LED Faults (SHORT_LED)
    3. A.1.3.3 LED Short to GND Faults (GND_LED)
    4. A.1.3.4 Invalid LED String Faults (INVSTRING)
    5. A.1.3.5 I2C Timeout Faults
  4. A.1.4 Overview of the Fault and Protection Schemes
2. A.2 Programming Examples
  1. A.2.1 Clearing Fault Interrupts
  2. A.2.2 Disabling Fault Interrupts
  3. A.2.3 Diagnostic Registers

A.1 Protection and Fault Detections

The LP886XX-Q1 device device includes fault detections for LED open and short conditions, boost input undervoltage, overvoltage and overcurrent, boost output overvoltage and overcurrent, VDD undervoltage, and die overtemperature. The host can monitor the status of the faults in registers SUPPLY_FAULT_STATUS, BOOST_FAULT_STATUS and LED_STATUS.