SNVK008 April   2024 TPS7H4011-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Biased Test Configuration and Condition
  6. 3TI Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
      1. 3.2.1 Electrical Characteristics
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix A: HDR Results Report at 100krad(Si)

Abstract

This report discusses the results of the TID testing for the Texas Instruments TPS7H4011-SP 4.5V to 14V input, 12A radiation hardened synchronous buck converter.

This preliminary report presents the results of the total-ionizing dose (TID) testing for the pre-production TPS7H4011-SP silicon. The study was done to determine TID effects under high dose rate (HDR) up to 100krad(Si) after 168h anneal at room temperature.

The results show that all samples passed within the specified limits up to 100krad(Si).
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