SPNS242A October   2014  – June 2015

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
  4. 4Terminal Configuration and Functions
    1. 4.1 PZ QFP Package Pinout (100-Pin)
    2. 4.2 Terminal Functions
      1. 4.2.1  High-End Timer (N2HET)
      2. 4.2.2  Enhanced Quadrature Encoder Pulse Modules (eQEP)
      3. 4.2.3  General-Purpose Input/Output (GPIO)
      4. 4.2.4  Controller Area Network Interface Modules (DCAN1, DCAN2)
      5. 4.2.5  Multibuffered Serial Peripheral Interface (MibSPI1)
      6. 4.2.6  Standard Serial Peripheral Interface (SPI2)
      7. 4.2.7  Local Interconnect Network Controller (LIN)
      8. 4.2.8  Multibuffered Analog-to-Digital Converter (MibADC)
      9. 4.2.9  System Module
      10. 4.2.10 Error Signaling Module (ESM)
      11. 4.2.11 Main Oscillator
      12. 4.2.12 Test/Debug Interface
      13. 4.2.13 Flash
      14. 4.2.14 Core Supply
      15. 4.2.15 I/O Supply
      16. 4.2.16 Core and I/O Supply Ground Reference
    3. 4.3 Output Multiplexing and Control
      1. 4.3.1 Notes on Output Multiplexing
      2. 4.3.2 General Rules for Multiplexing Control Registers
    4. 4.4 Special Multiplexed Options
      1. 4.4.1 Filtering for eQEP Inputs
        1. 4.4.1.1 eQEPA Input
        2. 4.4.1.2 eQEPB Input
        3. 4.4.1.3 eQEPI Input
        4. 4.4.1.4 eQEPS Input
      2. 4.4.2 N2HET PIN_nDISABLE Input Port
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Power-On Hours (POH)
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Switching Characteristics Over Recommended Operating Conditions for Clock Domains
    6. 5.6  Wait States Required
    7. 5.7  Power Consumption
    8. 5.8  Thermal Resistance Characteristics for PZ
    9. 5.9  Input/Output Electrical Characteristics
    10. 5.10 Output Buffer Drive Strengths
    11. 5.11 Input Timings
    12. 5.12 Output Timings
  6. 6System Information and Electrical Specifications
    1. 6.1  Voltage Monitor Characteristics
      1. 6.1.1 Important Considerations
      2. 6.1.2 Voltage Monitor Operation
      3. 6.1.3 Supply Filtering
    2. 6.2  Power Sequencing and Power-On Reset
      1. 6.2.1 Power-Up Sequence
      2. 6.2.2 Power-Down Sequence
      3. 6.2.3 Power-On Reset: nPORRST
        1. 6.2.3.1 nPORRST Electrical and Timing Requirements
    3. 6.3  Warm Reset (nRST)
      1. 6.3.1 Causes of Warm Reset
      2. 6.3.2 nRST Timing Requirements
    4. 6.4  ARM Cortex-R4 CPU Information
      1. 6.4.1 Summary of ARM Cortex-R4 CPU Features
      2. 6.4.2 ARM Cortex-R4 CPU Features Enabled by Software
      3. 6.4.3 Dual Core Implementation
      4. 6.4.4 Duplicate clock tree after GCLK
      5. 6.4.5 ARM Cortex-R4 CPU Compare Module (CCM) for Safety
      6. 6.4.6 CPU Self-Test
        1. 6.4.6.1 Application Sequence for CPU Self-Test
        2. 6.4.6.2 CPU Self-Test Clock Configuration
        3. 6.4.6.3 CPU Self-Test Coverage
    5. 6.5  Clocks
      1. 6.5.1 Clock Sources
        1. 6.5.1.1 Main Oscillator
          1. 6.5.1.1.1 Timing Requirements for Main Oscillator
        2. 6.5.1.2 Low-Power Oscillator
          1. 6.5.1.2.1 Features
          2. 6.5.1.2.2 LPO Electrical and Timing Specifications
        3. 6.5.1.3 Phase Locked Loop (PLL) Clock Modules
          1. 6.5.1.3.1 Block Diagram
          2. 6.5.1.3.2 PLL Timing Specifications
      2. 6.5.2 Clock Domains
        1. 6.5.2.1 Clock Domain Descriptions
        2. 6.5.2.2 Mapping of Clock Domains to Device Modules
      3. 6.5.3 Clock Test Mode
    6. 6.6  Clock Monitoring
      1. 6.6.1 Clock Monitor Timings
      2. 6.6.2 External Clock (ECLK) Output Functionality
      3. 6.6.3 Dual Clock Comparator
        1. 6.6.3.1 Features
        2. 6.6.3.2 Mapping of DCC Clock Source Inputs
    7. 6.7  Glitch Filters
    8. 6.8  Device Memory Map
      1. 6.8.1 Memory Map Diagram
      2. 6.8.2 Memory Map Table
      3. 6.8.3 Master/Slave Access Privileges
    9. 6.9  Flash Memory
      1. 6.9.1 Flash Memory Configuration
      2. 6.9.2 Main Features of Flash Module
      3. 6.9.3 ECC Protection for Flash Accesses
      4. 6.9.4 Flash Access Speeds
    10. 6.10 Flash Program and Erase Timings for Program Flash
    11. 6.11 Flash Program and Erase Timings for Data Flash
    12. 6.12 Tightly Coupled RAM Interface Module
      1. 6.12.1 Features
      2. 6.12.2 TCRAMW ECC Support
    13. 6.13 Parity Protection for Accesses to peripheral RAMs
    14. 6.14 On-Chip SRAM Initialization and Testing
      1. 6.14.1 On-Chip SRAM Self-Test Using PBIST
        1. 6.14.1.1 Features
        2. 6.14.1.2 PBIST RAM Groups
      2. 6.14.2 On-Chip SRAM Auto Initialization
    15. 6.15 Vectored Interrupt Manager
      1. 6.15.1 VIM Features
      2. 6.15.2 Interrupt Request Assignments
    16. 6.16 Real-Time Interrupt Module
      1. 6.16.1 Features
      2. 6.16.2 Block Diagrams
      3. 6.16.3 Clock Source Options
    17. 6.17 Error Signaling Module
      1. 6.17.1 Features
      2. 6.17.2 ESM Channel Assignments
    18. 6.18 Reset / Abort / Error Sources
    19. 6.19 Digital Windowed Watchdog
    20. 6.20 Debug Subsystem
      1. 6.20.1 Block Diagram
      2. 6.20.2 Debug Components Memory Map
      3. 6.20.3 JTAG Identification Code
      4. 6.20.4 Debug ROM
      5. 6.20.5 JTAG Scan Interface Timings
      6. 6.20.6 Advanced JTAG Security Module
      7. 6.20.7 Boundary Scan Chain
  7. 7Peripheral Information and Electrical Specifications
    1. 7.1 Peripheral Legend
    2. 7.2 Multibuffered 12-Bit Analog-to-Digital Converter
      1. 7.2.1 Features
      2. 7.2.2 Event Trigger Options
        1. 7.2.2.1 MIBADC Event Trigger Hookup
      3. 7.2.3 ADC Electrical and Timing Specifications
      4. 7.2.4 Performance (Accuracy) Specifications
        1. 7.2.4.1 MibADC Nonlinearity Errors
        2. 7.2.4.2 MibADC Total Error
    3. 7.3 General-Purpose Input/Output
      1. 7.3.1 Features
    4. 7.4 Enhanced High-End Timer (N2HET)
      1. 7.4.1 Features
      2. 7.4.2 N2HET RAM Organization
      3. 7.4.3 Input Timing Specifications
      4. 7.4.4 N2HET Checking
        1. 7.4.4.1 Output Monitoring using Dual Clock Comparator (DCC)
      5. 7.4.5 Disabling N2HET Outputs
      6. 7.4.6 High-End Timer Transfer Unit (N2HET)
        1. 7.4.6.1 Features
        2. 7.4.6.2 Trigger Connections
    5. 7.5 Controller Area Network (DCAN)
      1. 7.5.1 Features
      2. 7.5.2 Electrical and Timing Specifications
    6. 7.6 Local Interconnect Network Interface (LIN)
      1. 7.6.1 LIN Features
    7. 7.7 Multibuffered / Standard Serial Peripheral Interface
      1. 7.7.1 Features
      2. 7.7.2 MibSPI Transmit and Receive RAM Organization
      3. 7.7.3 MibSPI Transmit Trigger Events
        1. 7.7.3.1 MIBSPI1 Event Trigger Hookup
      4. 7.7.4 MibSPI/SPI Master Mode I/O Timing Specifications
      5. 7.7.5 SPI Slave Mode I/O Timings
    8. 7.8 Enhanced Quadrature Encoder (eQEP)
      1. 7.8.1 Clock Enable Control for eQEPx Modules
      2. 7.8.2 Using eQEPx Phase Error
      3. 7.8.3 Input Connections to eQEPx Modules
      4. 7.8.4 Enhanced Quadrature Encoder Pulse (eQEPx) Timing
  8. 8Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
        1. 8.1.1.1 Getting Started
      2. 8.1.2 Device Nomenclature
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation from Texas Instruments
    3. 8.3 Community Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
    7. 8.7 Device Identification Code Register
    8. 8.8 Die Identification Registers
    9. 8.9 Module Certifications
      1. 8.9.1 DCAN Certification
      2. 8.9.2 LIN Certifications
        1. 8.9.2.1 LIN Master Mode
        2. 8.9.2.2 LIN Slave Mode - Fixed Baud Rate
        3. 8.9.2.3 LIN Slave Mode - Adaptive Baud Rate
  9. 9Mechanical Packaging and Orderable Addendum
    1. 9.1 Packaging Information

8 Device and Documentation Support

8.1 Device Support

8.1.1 Development Support

Texas Instruments (TI) offers an extensive line of development tools for the Hercules™ Safety generation of MCUs, including tools to evaluate the performance of the processors, generate code, develop algorithm implementations, and fully integrate and debug software and hardware modules.

The following products support development of Hercules™-based applications:

Software Development Tools

  • Code Composer Studio™ Integrated Development Environment (IDE)
    • C/C++ Compiler
    • Code generation tools
    • Assembler/Linker
    • Cycle Accurate Simulator
  • Application algorithms
  • Sample applications code

Hardware Development Tools

  • Development and evaluation boards
  • JTAG-based emulators - XDS100™v2, XDS200, XDS560™ v2 emulator
  • Flash programming tools
  • Power supply
  • Documentation and cables

8.1.1.1 Getting Started

This section gives a brief overview of the steps to take when first developing for a TMS570 MCU device. For more detail on each of these steps, see the following:

  • Initialization of Hercules™ ARM® Cortex®-R4F Microcontrollers (SPNA106)

8.1.2 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all devices. Each commercial family member has one of three prefixes: TMX, TMP, or TMS. These prefixes represent evolutionary stages of product development from engineering prototypes (TMX) through fully qualified production devices (TMS).

Device development evolutionary flow:

    TMX Experimental device that is not necessarily representative of the final device's electrical specifications.
    TMP Final silicon die that conforms to the device's electrical specifications but has not completed quality and reliability verification.
    TMS Fully-qualified production device.

TMX and TMP devices are shipped against the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

TMS devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.

Predictions show that prototype devices (TMX or TMP) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.

Figure 8-1 illustrates the numbering and symbol nomenclature for the TMS570LS0232.

TMS570LS0232 device_numbering_conv_f8_spns242.gifFigure 8-1 Device Numbering Conventions

8.2 Documentation Support

The following documents describe the TMS570LS0232 microcontroller.

    SPNU603TMS570LS0232 16/32-Bit RISC Flash Microcontroller Technical Reference Manual details the integration, the environment, the functional description, and the programming models for each peripheral and subsystem in the device.
    SPNZ217TMS570LS0232 Microcontroller Silicon Revision A, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision(s).
    SPNZ229TMS570LS0232 Microcontroller Silicon Revision B, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision(s).
    SPNA207Calculating Equivalent Power-on-Hours for Hercules™ Safety MCUs details how to use the spreadsheet to calculate the aging effect of temperature on Texas Instruments Hercules Safety MCUs.

8.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help developers get started with Embedded Processors from Texas Instruments and to foster innovation and growth of general knowledge about the hardware and software surrounding these devices.

8.4 Trademarks

Hercules, Code Composer Studio, XDS100, XDS560, E2E are trademarks of Texas Instruments.

ARM, Cortex are registered trademarks of ARM Limited (or its subsidiaries) in the EU and.

CoreSight is a trademark of ARM Limited.

All other trademarks are the property of their respective owners.

8.5 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

8.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.

8.7 Device Identification Code Register

The device identification code register identifies several aspects of the device including the silicon version. The details of the device identification code register are shown in Table 8-1. The device identification code register value for this device is:

  • Rev 0 = 0x8048AD05
  • Rev A = 0x8048AD0D
  • Rev B = 0x8048AD15

Figure 8-2 Device ID Bit Allocation Register
31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
CP-15 UNIQUE ID TECH
R-1 R-00000000100100 R-0
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
TECH I/O VOLTAGE PERIPH PARITY FLASH ECC RAM ECC VERSION 1 0 1
R-101 R-0 R-1 R-10 R-1 R-00001 R-1 R-0 R-1
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 8-1 Device ID Bit Allocation Register Field Descriptions

BIT FIELD VALUE DESCRIPTION
31 CP15 Indicates the presence of coprocessor 15
1 CP15 present
30-17 UNIQUE ID 100100

Silicon version (revision) bits.

This bit field holds a unique number for a dedicated device configuration (die).
16-13 TECH Process technology on which the device is manufactured.
0101 F021
12 I/O VOLTAGE I/O voltage of the device.
0 I/O are 3.3v
11 PERIPHERAL PARITY Peripheral Parity
1 Parity on peripheral memories
10-9 FLASH ECC Flash ECC
10 Program memory with ECC
8 RAM ECC Indicates if RAM memory ECC is present.
1 ECC implemented
7-3 REVISION 0 Revision of the Device.
2-0 FAMILY ID 101 The platform family ID is always 0b101

8.8 Die Identification Registers

The two die ID registers at addresses 0xFFFFFF7C and 0xFFFFFF80 form a 64-bit die id with the information as shown in Table 8-2.

Table 8-2 Die-ID Registers

ITEM NO. OF BITS BIT LOCATION
X Coord. on Wafer 12 0xFFFFFF7C[11:0]
Y Coord. on Wafer 12 0xFFFFFF7C[23:12]
Wafer # 8 0xFFFFFF7C[31:24]
Lot # 24 0xFFFFFF80[23:0]
Reserved 8 0xFFFFFF80[31:24]

8.9 Module Certifications

The following communications modules have received certification of adherence to a standard.

8.9.1 DCAN Certification

TMS570LS0232 CAN_Certification_2011_02_08.pngFigure 8-3 DCAN Certification

8.9.2 LIN Certifications

8.9.2.1 LIN Master Mode

TMS570LS0232 LIN_Certification_DLL21_Master_20121130_130513_TMS570LS_V1 0.pngFigure 8-4 LIN Certification - Master Mode

8.9.2.2 LIN Slave Mode - Fixed Baud Rate

TMS570LS0232 LIN_Certification_DLL21_Slave_Fixed_20121130_130513_TMS570LS_V1 0.pngFigure 8-5 LIN Certification - Slave Mode - Fixed Baud Rate

8.9.2.3 LIN Slave Mode - Adaptive Baud Rate

TMS570LS0232 new_LIN_Certification_Slave_Adapt.pngFigure 8-6 LIN Certification - Slave Mode - Adaptive Baud Rate
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