SPRABI1D January   2018  – July 2022 66AK2E05 , 66AK2G12 , 66AK2H06 , 66AK2H12 , 66AK2H14 , 66AK2L06 , AM5K2E02 , AM5K2E04 , SM320C6678-HIREL , TMS320C6652 , TMS320C6654 , TMS320C6655 , TMS320C6657 , TMS320C6670 , TMS320C6671 , TMS320C6672 , TMS320C6674 , TMS320C6678

 

  1.   Trademarks
  2. 1 Introduction
  3. 2 Background
  4. 3 Migrating Designs From DDR2 to DDR3 (Features and Comparisons)
    1. 3.1 Topologies
      1. 3.1.1 Balanced Line Topology
        1. 3.1.1.1 Balanced Line Topology Issues
      2. 3.1.2 Fly-By Topology
        1. 3.1.2.1 Balanced Line Topology Issues
    2. 3.2 ECC (Error Correction)
    3. 3.3 DDR3 Features and Improvements
      1. 3.3.1 Read Leveling
      2. 3.3.2 Write Leveling
      3. 3.3.3 Pre-fetch
      4. 3.3.4 ZQ Calibration
      5. 3.3.5 Reset Pin Functionality
      6. 3.3.6 Additional DDR2 to DDR3 Differences
  5. 4 Prerequisites
    1. 4.1 High Speed Designs
    2. 4.2 JEDEC DDR3 Specification – Compatibility and Familiarity
    3. 4.3 Memory Types
    4. 4.4 Memory Speeds
    5. 4.5 Addressable Memory Space
    6. 4.6 DDR3 SDRAM/UDIMM Memories, Topologies, and Configurations
      1. 4.6.1 Topologies
      2. 4.6.2 Configurations
        1. 4.6.2.1 Memories – SDRAM Selection Criteria
    7. 4.7 DRAM Electrical Interface Requirements
      1. 4.7.1 Slew
      2. 4.7.2 Overshoot and Undershoot Specifications
        1. 4.7.2.1 Overshoot and Undershoot Example Calculations
      3. 4.7.3 Typical DDR3 AC and DC Characteristics
      4. 4.7.4 DDR3 Tolerances and Noise – Reference Signals
  6. 5 Package Selection
    1. 5.1 Summary
      1. 5.1.1 ×4 SDRAM
      2. 5.1.2 ×8 SDRAM
      3. 5.1.3 ×16 SDRAM
      4. 5.1.4 ×32 SDRAM
      5. 5.1.5 ×64 SDRAM
  7. 6 Physical Design and Implementation
    1. 6.1 Electrical Connections
      1. 6.1.1 Pin Connectivity and Unused Pins – SDRAM Examples
      2. 6.1.2 Pin Connectivity – ECC UDIMM and Non-ECC UDIMM Examples
    2. 6.2 Signal Terminations
      1. 6.2.1 External Terminations – When Using Read and Write Leveling
      2. 6.2.2 External Terminations – When Read and Write Leveling is Not Used
      3. 6.2.3 Internal Termination – On-Die Terminations
      4. 6.2.4 Active Terminations
      5. 6.2.5 Passive Terminations
      6. 6.2.6 Termination Component Selection
    3. 6.3 Mechanical Layout and Routing Considerations
      1. 6.3.1 Routing Considerations – SDRAMs
        1. 6.3.1.1  Mechanical Layout – SDRAMs
        2. 6.3.1.2  Stack Up – SDRAMs
        3. 6.3.1.3  Routing Rules – General Overview (SDRAMs)
        4. 6.3.1.4  Routing Rules – Address and Command Lines (SDRAMs)
        5. 6.3.1.5  Routing Rules – Control Lines (SDRAMs)
        6. 6.3.1.6  Routing Rules – Data Lines (SDRAMs)
        7. 6.3.1.7  Routing Rules – Clock Lines (SDRAMs)
        8. 6.3.1.8  Routing Rules – Power (SDRAMs)
        9. 6.3.1.9  Write Leveling Limit Impact on Routing – KeyStone I
        10. 6.3.1.10 Round-Trip Delay Impact on Routing – KeyStone I
        11. 6.3.1.11 Write Leveling Limit Impact on Routing – KeyStone II
        12. 6.3.1.12 Round-Trip Delay Impact on Routing – KeyStone II
      2. 6.3.2 Routing Considerations – UDIMMs
        1. 6.3.2.1 Mechanical Layout – UDIMMs
        2. 6.3.2.2 Stack Up – UDIMMs
        3. 6.3.2.3 Routing Rules – General Overview (UDIMMs)
        4. 6.3.2.4 Routing Rules – Address and Command Lines (UDIMMs)
        5. 6.3.2.5 Routing Rules – Control Lines (UDIMMs)
        6. 6.3.2.6 Routing Rules – Data Lines (UDIMMs)
        7. 6.3.2.7 Routing Rules – Clock Lines (UDIMMs)
        8. 6.3.2.8 Routing Rules – Power (UDIMMs)
        9. 6.3.2.9 Write-Leveling Limit Impact on Routing
    4. 6.4 Timing Considerations
    5. 6.5 Impedance Considerations
      1. 6.5.1 Routing Impedances – KeyStone I Devices
        1. 6.5.1.1 Data Group Signals
        2. 6.5.1.2 Fly-By Signals
      2. 6.5.2 Routing Impedances – KeyStone II Devices
        1. 6.5.2.1 Data Group Signals
        2. 6.5.2.2 Fly-By Signals
      3. 6.5.3 Comparison to JEDEC UDIMM Impedance Recommendations
    6. 6.6 Switching and Output Considerations
  8. 7 Simulation and Modeling
    1. 7.1 Simulation and Modeling
    2. 7.2 Tools
    3. 7.3 Models
    4. 7.4 TI Commitment
  9. 8 Power
    1. 8.1 DDR3 SDRAM Power Requirements
      1. 8.1.1 Vref Voltage Requirements
      2. 8.1.2 VTT Voltage Requirements
    2. 8.2 DSP DDR3 Power Requirements
    3. 8.3 DDR3 Power Estimation
    4. 8.4 DSP DDR3 Interface Power Estimation
    5. 8.5 Sequencing – DDR3 and DSP
  10. 9 Disclaimers
  11. 10References
  12. 11Revision History

6.3.1.8 Routing Rules – Power (SDRAMs)

When routing the DDR3 SDRAM Vref voltages, it is necessary to decouple them at the SDRAMs and not at the source. The use of 0.01-µF and 0.1-µF ceramic capacitors (0402 or smaller recommended) should be distributed across the Vref power rail with one 0.01-µF and 0.1-µF ceramic capacitor located at each Vref pin, and one 0.1-µF capacitor directly at the source. Traces between the decoupling capacitors and Vref pins should be a minimum of 30 mils (0.762 mm) wide and as short as possible. The Vref pins and interconnection to decoupling capacitors should maintain a minimum of 15 mils (0.381 mm) spacing from all other nets. All Vref nets should be routed on the top layer. Vref pins should be isolated with, or shielded with ground.

When routing the SDRAM VTT power supply, the regulator should be kept close to the VTT pin on the respective SDRAMs. In most cases, a VTT voltage island will be used, and it is recommended that the voltage island be placed on the component side signal layer. There should be a minimum of one 0.1-µF decoupling capacitor close to each VTT SDRAM pin and a minimum of one 10-µF to 22-µF bulk ceramic (low ESR) capacitor on the VTT island. The number of VTT bulk capacitors is based on the size of the island, and topology and loading.
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