1 Introduction

This document introduces the three stages of reliability and shows the current generation of TI industrial grade EP product is designed to support a useful lifetime of 10 year operating at 105°C junction temperature (T_J).

Based on the physics of failure approach, it shows useful life scales with temperature and decreasing the effective temperature below 105°C T_J, can extend the useful lifetime of the silicon beyond 10 years. Similarly, increasing the effective temperature above the 105°C T_J will shorten lifetime.

Using a case study of an actual system level mission profile, it shows how to calculate if the EP will be operating within its target useful lifetime for which it was designed.